3HX3
Crystal structure of CRALBP mutant R234W
Experimental procedure
Experimental method | SAD |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2008-09-22 |
Detector | PSI PILATUS 6M |
Wavelength(s) | 0.97930 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 87.930, 57.880, 75.150 |
Unit cell angles | 90.00, 122.85, 90.00 |
Refinement procedure
Resolution | 45.577 - 1.690 |
R-factor | 0.169 |
Rwork | 0.167 |
R-free | 0.18400 |
Structure solution method | SAD |
RMSD bond length | 0.005 |
RMSD bond angle | 1.176 |
Data reduction software | MOSFLM |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 45.577 | 1.800 |
High resolution limit [Å] | 1.690 | 1.690 |
Rmerge | 0.048 | 0.576 |
Number of reflections | 67824 | 9663 |
<I/σ(I)> | 19.8 | 2.7 |
Completeness [%] | 97.4 | 86.1 |
Redundancy | 5.6 | 4.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 7.5 | 298 | PEG 3000, NaCl, pH 7.5, VAPOR DIFFUSION, temperature 298K |