1ZRL

Crystal structure of EBA-175 Region II (RII)

Experimental procedure

Source type	SYNCHROTRON
Source details	NSLS BEAMLINE X25
Synchrotron site	NSLS
Beamline	X25
Temperature [K]	100
Detector technology	CCD
Detector	ADSC QUANTUM 315
Wavelength(s)	1.1
Spacegroup name	P 41 2 2
Unit cell lengths	103.645, 103.645, 212.722
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	36.650 - 2.300
R-factor	0.232
Rwork	0.232
R-free	0.27900
Structure solution method	MAD, CROSS CRYSTAL AVERAGING
RMSD bond length	0.010
RMSD bond angle	1.400
Data reduction software	HKL-2000
Data scaling software	SCALEPACK
Phasing software	SHARP
Refinement software	CNS (1.1)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	36.650	2.380
High resolution limit [Å]	2.300	2.300
Rmerge	0.094	0.503
Number of reflections	53219
<I/σ(I)>	18.2	4.6
Completeness [%]		92.8
Redundancy	4.2

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP	6.5	290	high salt, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K
1	VAPOR DIFFUSION, HANGING DROP	6.5	290	high salt, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K
1	VAPOR DIFFUSION, HANGING DROP	6.5	290	high salt, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 290K