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1RFX

Crystal Structure of resisitin

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsNSLS BEAMLINE X4A
Synchrotron siteNSLS
BeamlineX4A
Temperature [K]110
Detector technologyCCD
Collection date2002-06-14
DetectorADSC QUANTUM 4
Wavelength(s)1.54975
Spacegroup nameC 2 2 21
Unit cell lengths44.298, 174.670, 90.163
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution14.860 - 2.002
R-factor0.17915
Rwork0.177
R-free0.21597
Structure solution methodSAD
RMSD bond length0.009
RMSD bond angle1.230
Data reduction softwareDENZO
Data scaling softwareSCALEPACK
Phasing softwareSHARP
Refinement softwareREFMAC (5.1)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]30.0002.070
High resolution limit [Å]2.0002.000
Rmerge0.0710.213
Number of reflections24119
<I/σ(I)>259.6
Completeness [%]97.495.2
Redundancy25.2
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP22770.1M Sodium acetate, 8% PEG 4000, 0.1M Potassium Chloride, pH 2., VAPOR DIFFUSION, HANGING DROP, temperature 277K

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