7U1A
RFC:PCNA bound to dsDNA with a ssDNA gap of six nucleotides
7U1A の概要
| エントリーDOI | 10.2210/pdb7u1a/pdb |
| EMDBエントリー | 25616 25617 26298 |
| 分子名称 | Replication factor C subunit 1, PHOSPHOTHIOPHOSPHORIC ACID-ADENYLATE ESTER, MAGNESIUM ION, ... (12 entities in total) |
| 機能のキーワード | sliding clamp, dna replication&repair, aaa+, clamp loader, brct domain, replication, replication-dna complex, replication/dna |
| 由来する生物種 | Saccharomyces cerevisiae (baker's yeast) 詳細 |
| タンパク質・核酸の鎖数 | 11 |
| 化学式量合計 | 369265.94 |
| 構造登録者 | |
| 主引用文献 | Liu, X.,Gaubitz, C.,Pajak, J.,Kelch, B.A. A second DNA binding site on RFC facilitates clamp loading at gapped or nicked DNA. Elife, 11:-, 2022 Cited by PubMed Abstract: Clamp loaders place circular sliding clamp proteins onto DNA so that clamp-binding partner proteins can synthesize, scan, and repair the genome. DNA with nicks or small single-stranded gaps are common clamp-loading targets in DNA repair, yet these substrates would be sterically blocked given the known mechanism for binding of primer-template DNA. Here, we report the discovery of a second DNA binding site in the yeast clamp loader replication factor C (RFC) that aids in binding to nicked or gapped DNA. This DNA binding site is on the external surface and is only accessible in the open conformation of RFC. Initial DNA binding at this site thus provides access to the primary DNA binding site in the central chamber. Furthermore, we identify that this site can partially unwind DNA to create an extended single-stranded gap for DNA binding in RFC's central chamber and subsequent ATPase activation. Finally, we show that deletion of the BRCT domain, a major component of the external DNA binding site, results in defective yeast growth in the presence of DNA damage where nicked or gapped DNA intermediates occur. We propose that RFC's external DNA binding site acts to enhance DNA binding and clamp loading, particularly at DNA architectures typically found in DNA repair. PubMed: 35731107DOI: 10.7554/eLife.77483 主引用文献が同じPDBエントリー |
| 実験手法 | ELECTRON MICROSCOPY (3.3 Å) |
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