6IRK

Crystal structure of glucose isomerase by fixed-target serial femtosecond crystallography

6IRK の概要

• エントリーDOI: 10.2210/pdb6irk/pdb
• 分子名称: Xylose isomerase, MAGNESIUM ION (3 entities in total)
• 機能のキーワード: isomerase, xylose isomerase, sfx
• 由来する生物種: Streptomyces rubiginosus
• タンパク質・核酸の鎖数: 1
• 化学式量合計: 43331.91

構造登録者

Nam, K.H. (登録日: 2018-11-13, 公開日: 2019-05-22, 最終更新日: 2023-11-22)

主引用文献

Lee, D.,Baek, S.,Park, J.,Lee, K.,Kim, J.,Lee, S.J.,Chung, W.K.,Lee, J.L.,Cho, Y.,Nam, K.H.
Nylon mesh-based sample holder for fixed-target serial femtosecond crystallography.
Sci Rep, 9:6971-6971, 2019

PubMed Abstract: Fixed-target serial femtosecond crystallography (FT-SFX) was an important advance in crystallography by dramatically reducing sample consumption, while maintaining the benefits of SFX for obtaining crystal structures at room temperature without radiation damage. Despite a number of advantages, preparation of a sample holder for the sample delivery in FT-SFX with the use of many crystals in a single mount at ambient temperature is challenging as it can be complicated and costly, and thus, development of an efficient sample holder is essential. In this study, we introduced a nylon mesh-based sample holder enclosed by a polyimide film. This sample holder can be rapidly manufactured using a commercially available nylon mesh with pores of a desired size at a low cost without challenging technology. Furthermore, this simple device is highly efficient in data acquisition. We performed FT-SFX using a nylon mesh-based sample holder and collected over 130,000 images on a single sample holder using a 30 Hz X-ray pulse for 1.2 h. We determined the crystal structures of lysozyme and glucose isomerase using the nylon mesh at 1.65 and 1.75 Å, respectively. The nylon mesh exposed to X-rays produced very low levels of background scattering at 3.75 and 4.30 Å, which are negligible for data analysis. Our method provides a simple and rapid but highly efficient way to deliver samples for FT-SFX.

PubMed: 31061502
DOI: 10.1038/s41598-019-43485-z

実験手法

X-RAY DIFFRACTION (1.75 Å)