2OP3
The structure of cathepsin S with a novel 2-arylphenoxyacetaldehyde inhibitor derived by the Substrate Activity Screening (SAS) method
Summary for 2OP3
Entry DOI | 10.2210/pdb2op3/pdb |
Related | 2H7J 2HXZ |
Descriptor | Cathepsin S, SULFATE ION, 2-[(2',3',4'-TRIFLUOROBIPHENYL-2-YL)OXY]ETHANOL, ... (5 entities in total) |
Functional Keywords | cathepsin s, nonpeptidic, substrate activity screening, hydrolase |
Biological source | Homo sapiens (human) |
Cellular location | Lysosome: P25774 |
Total number of polymer chains | 2 |
Total formula weight | 50636.77 |
Authors | Spraggon, G.,Inagaki, H.,Tsuruoka, H.,Hornsby, M.,Lesley, S.A.,Ellman, J.A. (deposition date: 2007-01-26, release date: 2007-05-22, Last modification date: 2024-12-25) |
Primary citation | Inagaki, H.,Tsuruoka, H.,Hornsby, M.,Lesley, S.A.,Spraggon, G.,Ellman, J.A. Characterization and optimization of selective, nonpeptidic inhibitors of cathepsin S with an unprecedented binding mode. J.Med.Chem., 50:2693-2699, 2007 Cited by PubMed Abstract: The substrate activity screening (SAS) method, a substrate-based fragment identification and optimization method for the development of enzyme inhibitors, was previously applied to cathepsin S to obtain a novel (2-arylphenoxy)acetaldehyde inhibitor, 2, with a 0.49 microM Ki value (Wood, W. J. L.; Patterson, A. W.; Tsuruoka, H.; Jain, R. K.; Ellman, J. A. J. Am. Chem. Soc. 2005, 127, 15521-15527). In this paper we disclose the X-ray structure of a complex between cathepsin S and inhibitor 2 which reveals an unprecedented binding mode. On the basis of this structure, additional 2-biaryloxy substrates with greatly increased cleavage efficiency were designed. Conversion of the optimized substrates to the corresponding aldehyde inhibitors yielded a low molecular weight (304 Daltons) and potent (9.6 nM) cathepsin S inhibitor that showed from 100- to >1000-fold selectivity relative to cathepsins B, L, and K. PubMed: 17469812DOI: 10.1021/jm070111+ PDB entries with the same primary citation |
Experimental method | X-RAY DIFFRACTION (1.6 Å) |
Structure validation
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