4RVY
Serial Time resolved crystallography of Photosystem II using a femtosecond X-ray laser. The S state after two flashes (S3)
Replaces: 4Q54Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SLAC LCLS BEAMLINE CXI |
Synchrotron site | SLAC LCLS |
Beamline | CXI |
Temperature [K] | 283 |
Detector technology | PIXEL |
Collection date | 2012-01-25 |
Detector | CS-PAD CXI-1 |
Wavelength(s) | 2.05 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 136.610, 228.090, 308.680 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 102.295 - 5.500 |
R-factor | 0.2812 |
Rwork | 0.281 |
R-free | 0.29060 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 3ARC |
Data reduction software | CrystFEL |
Data scaling software | CrystFEL |
Phasing software | PHASER |
Refinement software | PHENIX ((phenix.refine: 1.8.2_1336)) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 102.295 | 102.312 | 5.662 |
High resolution limit [Å] | 5.500 | 12.585 | 5.500 |
Number of reflections | 32066 | ||
Completeness [%] | 99.9 | 100 | 100 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | Free interface diffusion | 7 | 283 | 100 mM Pipes pH 7.0, 5 mM CaCl2, 10 mM tocopherol, and 10-17% PEG 2000 , Free interface diffusion, temperature 283K, temperature 283.0K |