2ZPM
Crystal structure analysis of PDZ domain B
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL44XU |
| Synchrotron site | SPring-8 |
| Beamline | BL44XU |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Detector | Bruker DIP-6040 |
| Wavelength(s) | 0.65 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 70.141, 26.867, 42.789 |
| Unit cell angles | 90.00, 112.12, 90.00 |
Refinement procedure
| Resolution | 20.750 - 0.980 |
| R-factor | 0.15135 |
| Rwork | 0.150 |
| R-free | 0.18043 |
| Structure solution method | SAD |
| RMSD bond length | 0.023 |
| RMSD bond angle | 2.142 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | SHELXCD |
| Refinement software | REFMAC (5.5.0035) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 21.470 | 1.030 |
| High resolution limit [Å] | 0.980 | 0.980 |
| Rmerge | 0.044 | 0.446 |
| Number of reflections | 42333 | |
| <I/σ(I)> | 17.1 | 2.9 |
| Completeness [%] | 99.4 | 99 |
| Redundancy | 3.7 | 3.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 293 | 25% PEG3350, VAPOR DIFFUSION, temperature 293K |
