解像度: 2.1→37.46 Å / Cor.coef. Fo:Fc: 0.952 / Cor.coef. Fo:Fc free: 0.911 / SU B: 11.438 / SU ML: 0.155 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.239 / ESU R Free: 0.201 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.24982
1450
5.1 %
RANDOM
Rwork
0.19897
-
-
-
all
0.20165
29845
-
-
obs
0.20165
26853
94.83 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 44.59 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-1.08 Å2
0 Å2
-0 Å2
2-
-
-1.08 Å2
-0 Å2
3-
-
-
2.16 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.1→37.46 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3457
0
46
151
3654
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.019
3593
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
3355
X-RAY DIFFRACTION
r_angle_refined_deg
1.854
1.986
4830
X-RAY DIFFRACTION
r_angle_other_deg
0.888
3.001
7716
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.787
5
440
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
38.703
23.855
166
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.662
15
647
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
21.455
15
30
X-RAY DIFFRACTION
r_chiral_restr
0.11
0.2
529
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
4127
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
799
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.1→2.155 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.262
63
-
Rwork
0.261
1503
-
obs
-
-
71.41 %
精密化 TLS
手法: refined / Origin x: 64.8241 Å / Origin y: 24.3921 Å / Origin z: -0.0188 Å