構造決定の手法: 単波長異常分散 / 解像度: 1.888→36.592 Å / Cor.coef. Fo:Fc: 0.953 / Cor.coef. Fo:Fc free: 0.934 / SU B: 6.541 / SU ML: 0.097 / 交差検証法: THROUGHOUT / ESU R: 0.14 / ESU R Free: 0.131 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Rfree
0.2242
1609
5.095 %
Rwork
0.191
29968
-
all
0.193
-
-
obs
-
31577
99.64 %
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 29.89 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.727 Å2
0 Å2
-0 Å2
2-
-
-1.447 Å2
0 Å2
3-
-
-
-0.28 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.888→36.592 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2498
0
0
260
2758
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.013
2542
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.017
2412
X-RAY DIFFRACTION
r_angle_refined_deg
1.869
1.643
3428
X-RAY DIFFRACTION
r_angle_other_deg
1.462
1.594
5607
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.762
5
321
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.8
25.789
114
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.495
15
469
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
27.489
15
4
X-RAY DIFFRACTION
r_chiral_restr
0.088
0.2
339
X-RAY DIFFRACTION
r_gen_planes_refined
0.01
0.02
2861
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
515
X-RAY DIFFRACTION
r_nbd_refined
0.199
0.2
497
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.18
0.2
2246
X-RAY DIFFRACTION
r_nbtor_refined
0.17
0.2
1256
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.082
0.2
1249
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.143
0.2
188
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.069
0.2
5
X-RAY DIFFRACTION
r_nbd_other
0.219
0.2
14
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.185
0.2
9
X-RAY DIFFRACTION
r_mcbond_it
1.731
2.109
1287
X-RAY DIFFRACTION
r_mcbond_other
1.729
2.108
1286
X-RAY DIFFRACTION
r_mcangle_it
2.578
3.153
1607
X-RAY DIFFRACTION
r_mcangle_other
2.578
3.155
1608
X-RAY DIFFRACTION
r_scbond_it
2.826
2.493
1255
X-RAY DIFFRACTION
r_scbond_other
2.825
2.495
1256
X-RAY DIFFRACTION
r_scangle_it
4.432
3.577
1821
X-RAY DIFFRACTION
r_scangle_other
4.431
3.579
1822
X-RAY DIFFRACTION
r_lrange_it
6.346
41.954
10992
X-RAY DIFFRACTION
r_lrange_other
6.21
41.347
10794
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Rfactor all
Num. reflection all
Fsc free
Fsc work
% reflection obs (%)
WRfactor Rwork
1.888-1.937
0.28
114
0.27
2152
0.271
2294
0.822
0.825
98.7794
0.251
1.937-1.99
0.27
115
0.227
2134
0.229
2253
0.891
0.877
99.8225
0.205
1.99-2.047
0.247
122
0.22
2047
0.221
2171
0.881
0.893
99.9079
0.195
2.047-2.11
0.232
87
0.186
2041
0.188
2130
0.921
0.927
99.9061
0.164
2.11-2.179
0.235
104
0.171
1958
0.174
2062
0.932
0.945
100
0.152
2.179-2.255
0.208
99
0.188
1897
0.189
1996
0.941
0.93
100
0.169
2.255-2.34
0.252
93
0.184
1835
0.187
1929
0.909
0.937
99.9482
0.167
2.34-2.435
0.186
101
0.174
1755
0.175
1860
0.952
0.948
99.7849
0.158
2.435-2.543
0.227
74
0.175
1712
0.177
1793
0.93
0.946
99.6096
0.161
2.543-2.666
0.205
87
0.172
1619
0.174
1706
0.937
0.95
100
0.163
2.666-2.81
0.22
75
0.167
1554
0.169
1630
0.942
0.96
99.9387
0.161
2.81-2.979
0.211
66
0.176
1488
0.177
1554
0.946
0.955
100
0.174
2.979-3.183
0.227
90
0.186
1363
0.189
1458
0.946
0.952
99.6571
0.187
3.183-3.436
0.248
100
0.199
1254
0.203
1370
0.933
0.946
98.8321
0.206
3.436-3.761
0.214
65
0.186
1203
0.187
1269
0.947
0.962
99.9212
0.198
3.761-4.199
0.171
52
0.178
1099
0.178
1151
0.967
0.966
100
0.196
4.199-4.838
0.167
55
0.159
949
0.16
1025
0.973
0.973
97.9512
0.184
4.838-5.9
0.254
43
0.218
843
0.22
888
0.951
0.957
99.7748
0.255
5.9-8.237
0.312
42
0.251
663
0.255
706
0.924
0.934
99.8584
0.29
8.237-36.592
0.27
25
0.247
402
0.249
441
0.938
0.95
96.8254
0.315
精密化 TLS
手法: refined / Origin x: 27.3882 Å / Origin y: 16.6269 Å / Origin z: 26.5254 Å