ソフトウェア | 名称 | バージョン | 分類 |
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BUSTER | 2.10.1精密化 | XDS | | データ削減 | SCALA | | データスケーリング | MOLREP | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 / 解像度: 1.96→26.38 Å / Cor.coef. Fo:Fc: 0.9338 / Cor.coef. Fo:Fc free: 0.9309 / SU R Cruickshank DPI: 0.164 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.181 / SU Rfree Blow DPI: 0.146 / SU Rfree Cruickshank DPI: 0.138
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.2261 | 1690 | 5 % | RANDOM |
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Rwork | 0.2086 | - | - | - |
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obs | 0.2095 | 33785 | 99.66 % | - |
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原子変位パラメータ | Biso mean: 40.23 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -3.1081 Å2 | 0 Å2 | 0 Å2 |
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2- | - | -3.1081 Å2 | 0 Å2 |
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3- | - | - | 6.2163 Å2 |
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Refine analyze | Luzzati coordinate error obs: 0.28 Å |
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精密化ステップ | サイクル: 1 / 解像度: 1.96→26.38 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2952 | 0 | 0 | 356 | 3308 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 | Restraint function | Weight |
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X-RAY DIFFRACTION | t_bond_d0.009 | 3014 | HARMONIC2 | X-RAY DIFFRACTION | t_angle_deg1.01 | 4045 | HARMONIC2 | X-RAY DIFFRACTION | t_dihedral_angle_d | 1087 | SINUSOIDAL2 | X-RAY DIFFRACTION | t_incorr_chiral_ct | | | | X-RAY DIFFRACTION | t_pseud_angle | | | | X-RAY DIFFRACTION | t_trig_c_planes | 95 | HARMONIC2 | X-RAY DIFFRACTION | t_gen_planes | 424 | HARMONIC5 | X-RAY DIFFRACTION | t_it | 3014 | HARMONIC20 | X-RAY DIFFRACTION | t_nbd | | | | X-RAY DIFFRACTION | t_omega_torsion2.98 | | | | X-RAY DIFFRACTION | t_other_torsion20.79 | | | | X-RAY DIFFRACTION | t_improper_torsion | | | | X-RAY DIFFRACTION | t_chiral_improper_torsion | 367 | SEMIHARMONIC5 | X-RAY DIFFRACTION | t_sum_occupancies | | | | X-RAY DIFFRACTION | t_utility_distance | | | | X-RAY DIFFRACTION | t_utility_angle | | | | X-RAY DIFFRACTION | t_utility_torsion | | | | X-RAY DIFFRACTION | t_ideal_dist_contact | 3674 | SEMIHARMONIC4 | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.96→2.02 Å / Total num. of bins used: 17
| Rfactor | 反射数 | %反射 |
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Rfree | 0.3351 | 144 | 5.01 % |
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Rwork | 0.2954 | 2731 | - |
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all | 0.2974 | 2875 | - |
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obs | - | - | 99.66 % |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 0.3033 | 0.2485 | 0.2518 | 0.9404 | -0.0399 | 1.318 | -0.0126 | 0.0769 | 0.025 | -0.0407 | -0.0057 | -0.0088 | 0.0214 | 0.0364 | 0.0184 | -0.0318 | 0.0086 | 0.0062 | -0.0727 | 0.0065 | 0.0019 | 39.4301 | 5.2078 | 8.4306 | 2 | 0.7681 | -0.2936 | -0.1711 | 0.16 | -0.0458 | 0.8442 | 0.0197 | -0.0953 | -0.0292 | 0.047 | -0.0054 | 0.0065 | 0.0592 | -0.1134 | -0.0142 | -0.0198 | -0.0376 | -0.0014 | -0.0195 | 0.0188 | -0.021 | 29.0583 | -2.298 | 29.0796 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Selection details |
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1 | X-RAY DIFFRACTION | 1 | { A|* }2 | X-RAY DIFFRACTION | 2 | { B|* } | |
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