解像度: 2.4→30 Å / Cor.coef. Fo:Fc: 0.947 / Cor.coef. Fo:Fc free: 0.942 / Rfactor Rfree error: 0 / SU R Cruickshank DPI: 0.301 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.294 / SU Rfree Blow DPI: 0.21 / SU Rfree Cruickshank DPI: 0.214 詳細: THERE ARE SOME UNKNOWN DENSITIES FOR ATOMS IN THE ORTHOSTERIC BINDING SITE. THEY HAVE BEEN MODELLED AS UNX.
Rfactor
反射数
%反射
Selection details
Rfree
0.233
1344
6.18 %
RANDOM
Rwork
0.21
-
-
-
obs
0.211
21742
99.6 %
-
原子変位パラメータ
Biso mean: 94.42 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-6.5203 Å2
0 Å2
0 Å2
2-
-
3.5707 Å2
0 Å2
3-
-
-
2.9497 Å2
Refine analyze
Luzzati coordinate error obs: 0.37 Å
精密化ステップ
サイクル: 1 / 解像度: 2.4→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2993
0
178
27
3198
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.007
3245
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
0.76
4376
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
1476
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
55
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
458
HARMONIC
5
X-RAY DIFFRACTION
t_it
3245
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
0
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_omega_torsion
4.11
X-RAY DIFFRACTION
t_other_torsion
2.4
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
411
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
4020
SEMIHARMONIC
4
LS精密化 シェル
解像度: 2.4→2.52 Å / Rfactor Rfree error: 0 / Total num. of bins used: 11