温度: 277 K / 手法: 蒸気拡散法, シッティングドロップ法 / pH: 5.6 / 詳細: Mg Acetate, Na Citrate, PEG 10000 / PH範囲: 5.4-5.8 Temp details: set trays up at RT, moved to cold room (4 Celsius)
解像度: 2.034→29.22 Å / SU ML: 0.23 / 交差検証法: FREE R-VALUE / σ(F): 1.55 / 位相誤差: 21.9 詳細: Author claims "Two densities were observed in the solvent-accessible area adjacent to residues 52-56 in both copies in the ASU. Density is observed at FoFc contour levels past 6 sigma. We ...詳細: Author claims "Two densities were observed in the solvent-accessible area adjacent to residues 52-56 in both copies in the ASU. Density is observed at FoFc contour levels past 6 sigma. We attempted modeling of acetate (too small) and citrate (too large), both present in the crystallization conditions, but the fit was unsatisfactory. Thus, the final uploaded model does not account for these two large densities."
Rfactor
反射数
%反射
Selection details
Rfree
0.2285
1993
9.22 %
random
Rwork
0.1769
-
-
-
obs
0.1816
21616
99.78 %
-
溶媒の処理
減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å
精密化ステップ
サイクル: LAST / 解像度: 2.034→29.22 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2052
0
5
138
2195
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.009
2128
X-RAY DIFFRACTION
f_angle_d
1.103
2902
X-RAY DIFFRACTION
f_dihedral_angle_d
13.523
772
X-RAY DIFFRACTION
f_chiral_restr
0.046
322
X-RAY DIFFRACTION
f_plane_restr
0.006
378
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
2.0335-2.0844
0.2867
135
0.2284
1323
X-RAY DIFFRACTION
97
2.0844-2.1407
0.2829
140
0.2122
1352
X-RAY DIFFRACTION
100
2.1407-2.2037
0.2727
143
0.2128
1388
X-RAY DIFFRACTION
100
2.2037-2.2748
0.2609
140
0.2105
1390
X-RAY DIFFRACTION
100
2.2748-2.3561
0.239
137
0.1904
1397
X-RAY DIFFRACTION
100
2.3561-2.4504
0.2503
140
0.1874
1379
X-RAY DIFFRACTION
100
2.4504-2.5618
0.2572
142
0.2
1407
X-RAY DIFFRACTION
100
2.5618-2.6968
0.287
141
0.2146
1392
X-RAY DIFFRACTION
100
2.6968-2.8656
0.2615
143
0.2058
1396
X-RAY DIFFRACTION
100
2.8656-3.0866
0.2817
143
0.2117
1396
X-RAY DIFFRACTION
100
3.0866-3.3969
0.2479
141
0.1941
1402
X-RAY DIFFRACTION
100
3.3969-3.8874
0.194
150
0.1598
1433
X-RAY DIFFRACTION
100
3.8874-4.894
0.1802
142
0.1332
1446
X-RAY DIFFRACTION
100
4.894-29.2235
0.2064
156
0.1621
1522
X-RAY DIFFRACTION
100
精密化 TLS
手法: refined / Origin x: 3.5469 Å / Origin y: 51.3325 Å / Origin z: 63.2053 Å