解像度: 2.3→29.71 Å / Rfactor Rfree error: 0.002 / Data cutoff high absF: 49218500.33 / Data cutoff low absF: 0 / 交差検証法: THROUGHOUT / σ(F): 0 詳細: BULK SOLVENT MODEL USED. Based on the electron density and local environment, residues LEU 102, HIS 103, ALA 143, ARG 192 and SER 213 of VP3 in UNP Q65480 were identified as PHE, THR, ASN, ...詳細: BULK SOLVENT MODEL USED. Based on the electron density and local environment, residues LEU 102, HIS 103, ALA 143, ARG 192 and SER 213 of VP3 in UNP Q65480 were identified as PHE, THR, ASN, ALA and ALA, respectively.
Rfactor
反射数
%反射
Selection details
Rfree
0.257
11604
4.9 %
RANDOM
Rwork
0.233
-
-
-
obs
0.233
235593
78 %
-
溶媒の処理
Bsol: 107.958 Å2 / ksol: 0.38 e/Å3
原子変位パラメータ
Biso mean: 32.1 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0 Å2
-0 Å2
0 Å2
2-
-
0 Å2
-0 Å2
3-
-
-
-0 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.35 Å
0.32 Å
Luzzati d res low
-
6 Å
Luzzati sigma a
0.52 Å
0.46 Å
精密化ステップ
サイクル: 1 / 解像度: 2.3→29.71 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
6202
0
49
341
6592
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
X-RAY DIFFRACTION
c_bond_d
0.011
X-RAY DIFFRACTION
c_bond_d_na
X-RAY DIFFRACTION
c_bond_d_prot
X-RAY DIFFRACTION
c_angle_d
X-RAY DIFFRACTION
c_angle_d_na
X-RAY DIFFRACTION
c_angle_d_prot
X-RAY DIFFRACTION
c_angle_deg
1.6
X-RAY DIFFRACTION
c_angle_deg_na
X-RAY DIFFRACTION
c_angle_deg_prot
X-RAY DIFFRACTION
c_dihedral_angle_d
26.3
X-RAY DIFFRACTION
c_dihedral_angle_d_na
X-RAY DIFFRACTION
c_dihedral_angle_d_prot
X-RAY DIFFRACTION
c_improper_angle_d
1.07
X-RAY DIFFRACTION
c_improper_angle_d_na
X-RAY DIFFRACTION
c_improper_angle_d_prot
X-RAY DIFFRACTION
c_mcbond_it
10.92
10
X-RAY DIFFRACTION
c_mcangle_it
11.32
20
X-RAY DIFFRACTION
c_scbond_it
13.97
12
X-RAY DIFFRACTION
c_scangle_it
15.5
25
Refine LS restraints NCS
NCS model details: CONSTR
LS精密化 シェル
解像度: 2.3→2.38 Å / Rfactor Rfree error: 0.01 / Total num. of bins used: 10