ソフトウェア | 名称 | バージョン | 分類 |
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HKL-2000 | | データ収集 | SOLVE | | 位相決定 | REFMAC | 5.5.0109精密化 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | |
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精密化 | 構造決定の手法: 多波長異常分散 / 解像度: 2→28.12 Å / Cor.coef. Fo:Fc: 0.974 / Cor.coef. Fo:Fc free: 0.968 / SU B: 3.779 / SU ML: 0.048 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.08 / ESU R Free: 0.078 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.169 | 2974 | 5.1 % | RANDOM |
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Rwork | 0.154 | - | - | - |
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obs | 0.155 | 55884 | 99.7 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 44.59 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2→28.12 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2707 | 0 | 30 | 150 | 2887 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.041 | 0.022 | 2818 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg2.798 | 1.917 | 3825 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.768 | 5 | 329 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg38.528 | 23.836 | 146 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg15.459 | 15 | 441 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg19.431 | 15 | 17 | X-RAY DIFFRACTION | r_chiral_restr0.295 | 0.2 | 385 | X-RAY DIFFRACTION | r_gen_planes_refined0.018 | 0.021 | 2206 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined | | | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined | | | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined | | | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it1.978 | 1.5 | 1645 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it3.434 | 2 | 2661 | X-RAY DIFFRACTION | r_scbond_it4.97 | 3 | 1173 | X-RAY DIFFRACTION | r_scangle_it7.94 | 4.5 | 1164 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2→2.05 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.203 | 198 | - |
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Rwork | 0.181 | 4094 | - |
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obs | - | - | 99.74 % |
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精密化 TLS | 手法: refined / Origin x: 83.5485 Å / Origin y: 60.5772 Å / Origin z: 94.315 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.0414 Å2 | -0.0002 Å2 | -0.0063 Å2 | - | 0.0353 Å2 | 0.0368 Å2 | - | - | 0.0483 Å2 |
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L | 0.252 °2 | -0.0938 °2 | 0.0986 °2 | - | 0.3347 °2 | -0.2084 °2 | - | - | 0.5428 °2 |
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S | 0.0143 Å ° | -0.0093 Å ° | -0.0038 Å ° | -0.0198 Å ° | -0.0374 Å ° | -0.025 Å ° | 0.0137 Å ° | -0.0195 Å ° | 0.0231 Å ° |
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