解像度: 1.51→1.54 Å / 冗長度: 7.9 % / Rmerge(I) obs: 0.527 / Mean I/σ(I) obs: 3 / % possible all: 93.5
-
解析
ソフトウェア
名称
バージョン
分類
JBluIce-EPICS
データ収集
SHELXS
位相決定
REFMAC
5.5.0109
精密化
HKL-2000
データ削減
HKL-2000
データスケーリング
精密化
構造決定の手法: 分子置換 / 解像度: 1.51→47.78 Å / Cor.coef. Fo:Fc: 0.973 / Cor.coef. Fo:Fc free: 0.963 / SU B: 2.248 / SU ML: 0.039 / 交差検証法: THROUGHOUT / ESU R: 0.069 / ESU R Free: 0.071 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.18227
5355
5 %
RANDOM
Rwork
0.15255
-
-
-
obs
0.15403
101577
94.2 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 22.636 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.06 Å2
0 Å2
0 Å2
2-
-
0.06 Å2
0 Å2
3-
-
-
-0.11 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.51→47.78 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
5162
0
129
944
6235
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.022
5512
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.427
1.992
7477
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.777
5
673
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.502
23.794
253
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.433
15
978
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.484
15
36
X-RAY DIFFRACTION
r_chiral_restr
0.099
0.2
805
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
4145
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.333
1.5
3247
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.196
2
5290
X-RAY DIFFRACTION
r_scbond_it
3.236
3
2265
X-RAY DIFFRACTION
r_scangle_it
5.041
4.5
2171
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.51→1.55 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.25
395
-
Rwork
0.221
7413
-
obs
-
-
94.49 %
精密化 TLS
手法: refined / Origin x: 20.7931 Å / Origin y: 71.5352 Å / Origin z: 15.4774 Å