解像度: 2.67→39.99 Å / Cor.coef. Fo:Fc: 0.9472 / Cor.coef. Fo:Fc free: 0.9399 / SU R Cruickshank DPI: 0.379 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.382 / SU Rfree Blow DPI: 0.243 / SU Rfree Cruickshank DPI: 0.245 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. ALL ATOMS HAVE CCP4 ATOM TYPE FROM LIBRARY
Rfactor
反射数
%反射
Selection details
Rfree
0.2198
636
4.91 %
RANDOM
Rwork
0.1865
-
-
-
obs
0.188
12944
99.25 %
-
原子変位パラメータ
Biso mean: 70.91 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.5056 Å2
0 Å2
0 Å2
2-
-
1.5056 Å2
0 Å2
3-
-
-
-3.0113 Å2
Refine analyze
Luzzati coordinate error obs: 0.354 Å
精密化ステップ
サイクル: LAST / 解像度: 2.67→39.99 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2178
0
34
46
2258
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.009
2251
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.1
3047
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
766
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
49
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
335
HARMONIC
5
X-RAY DIFFRACTION
t_it
2251
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.28
X-RAY DIFFRACTION
t_other_torsion
17.67
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
301
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
2590
SEMIHARMONIC
4
LS精密化 シェル
解像度: 2.67→2.88 Å / Total num. of bins used: 7
Rfactor
反射数
%反射
Rfree
0.2631
146
5.54 %
Rwork
0.2112
2490
-
all
0.214
2636
-
obs
-
-
99.25 %
精密化 TLS
手法: refined / Origin x: -25.4392 Å / Origin y: 29.5243 Å / Origin z: 10.0684 Å