解像度: 2.84→21.61 Å / Cor.coef. Fo:Fc: 0.9433 / Cor.coef. Fo:Fc free: 0.9341 / SU R Cruickshank DPI: 0.603 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.615 / SU Rfree Blow DPI: 0.291 / SU Rfree Cruickshank DPI: 0.294 詳細: IDEAL-DIST CONTACT TERM CONTACT SETUP. ALL ATOMS HAVE CCP4 ATOM TYPE FROM LIBRARY
Rfactor
反射数
%反射
Selection details
Rfree
0.2266
507
4.74 %
RANDOM
Rwork
0.1858
-
-
-
obs
0.1877
10688
99.84 %
-
原子変位パラメータ
Biso mean: 71.86 Å2
Baniso -1
Baniso -2
Baniso -3
1-
5.8867 Å2
0 Å2
0 Å2
2-
-
5.8867 Å2
0 Å2
3-
-
-
-11.7735 Å2
Refine analyze
Luzzati coordinate error obs: 0.373 Å
精密化ステップ
サイクル: LAST / 解像度: 2.84→21.61 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2188
0
21
34
2243
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
2250
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.14
3050
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
757
SINUSOIDAL
2
X-RAY DIFFRACTION
t_incorr_chiral_ct
X-RAY DIFFRACTION
t_pseud_angle
X-RAY DIFFRACTION
t_trig_c_planes
46
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
337
HARMONIC
5
X-RAY DIFFRACTION
t_it
2250
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
X-RAY DIFFRACTION
t_omega_torsion
2.33
X-RAY DIFFRACTION
t_other_torsion
18.87
X-RAY DIFFRACTION
t_improper_torsion
X-RAY DIFFRACTION
t_chiral_improper_torsion
304
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_sum_occupancies
X-RAY DIFFRACTION
t_utility_distance
X-RAY DIFFRACTION
t_utility_angle
X-RAY DIFFRACTION
t_utility_torsion
X-RAY DIFFRACTION
t_ideal_dist_contact
2630
SEMIHARMONIC
4
LS精密化 シェル
解像度: 2.84→3.17 Å / Total num. of bins used: 5
Rfactor
反射数
%反射
Rfree
0.2799
146
4.88 %
Rwork
0.2162
2847
-
all
0.2192
2993
-
obs
-
-
99.84 %
精密化 TLS
手法: refined / Origin x: -25.2999 Å / Origin y: 29.1889 Å / Origin z: 10.2011 Å