Protocol: SINGLE WAVELENGTH / Monochromatic (M) / Laue (L): M / Scattering type: x-ray
Radiation wavelength
Wavelength: 0.97833 Å / Relative weight: 1
Reflection
Redundancy: 3.6 % / Av σ(I) over netI: 25.57 / Number: 41830 / Rmerge(I) obs: 0.089 / Χ2: 1.84 / D res high: 4.2 Å / D res low: 40 Å / Num. obs: 11492 / % possible obs: 98.2
Diffraction reflection shell
Highest resolution (Å)
Lowest resolution (Å)
% possible obs (%)
ID
Rmerge(I) obs
Chi squared
Redundancy
10.3
40
90.1
1
0.059
3.089
3.3
8.2
10.3
98.5
1
0.063
3.004
3.5
7.17
8.2
97.7
1
0.076
2.501
3.6
6.52
7.17
98.6
1
0.103
2.1
3.6
6.05
6.52
99
1
0.163
1.775
3.7
5.7
6.05
99
1
0.247
1.857
3.7
5.41
5.7
97.8
1
0.312
1.654
3.7
5.18
5.41
99
1
0.305
1.611
3.7
4.98
5.18
99.1
1
0.338
1.626
3.7
4.81
4.98
99
1
0.339
1.526
3.7
4.66
4.81
98.9
1
0.485
1.471
3.7
4.52
4.66
99.6
1
0.766
1.437
3.7
4.4
4.52
99.1
1
0.798
1.423
3.7
4.3
4.4
99.4
1
0.943
1.428
3.7
4.2
4.3
99.3
1
1.272
3.7
Reflection
Resolution: 3.3→40 Å / Num. obs: 17761 / % possible obs: 73.4 % / Redundancy: 3.7 % / Rmerge(I) obs: 0.056 / Χ2: 1.494 / Net I/σ(I): 11.7
Reflection shell
Resolution (Å)
Redundancy (%)
Num. unique all
Χ2
Diffraction-ID
% possible all
Rmerge(I) obs
3.3-3.36
4.5
25
1.448
1
2.1
3.36-3.42
4.5
88
1.398
1
7.4
0.948
3.42-3.48
4.4
162
1.357
1
13.9
0.684
3.48-3.55
4.2
267
1.372
1
22.1
0.761
3.55-3.63
4.3
366
1.288
1
30.8
3.63-3.72
4.1
518
1.45
1
43.2
3.72-3.81
4
754
1.364
1
63.8
0.901
3.81-3.91
3.7
1140
1.258
1
94.8
0.997
3.91-4.03
3.7
1194
1.419
1
99.8
0.833
4.03-4.16
3.7
1190
1.327
1
100
0.446
4.16-4.31
3.7
1203
1.376
1
100
0.355
4.31-4.48
3.7
1196
1.475
1
99.9
0.212
4.48-4.68
3.7
1215
1.488
1
99.9
0.162
4.68-4.93
3.7
1202
1.465
1
99.8
0.102
4.93-5.24
3.7
1196
1.459
1
99.4
0.09
5.24-5.64
3.7
1207
1.519
1
99.3
0.094
5.64-6.21
3.6
1214
1.78
1
99
0.093
6.21-7.1
3.6
1218
1.931
1
98.5
0.057
7.1-8.94
3.6
1248
1.812
1
98.3
0.03
8.94-50
3.3
1158
1.342
1
86.9
0.019
-
Phasing
Phasing
Method: MIRAS
Phasing set
ID
1
2
3
Phasing dm
Method: Solvent flattening and Histogram matching / Reflection: 17850