ソフトウェア | 名称 | バージョン | 分類 |
---|
ADSC | Quantumデータ収集 | PHASER | | 位相決定 | REFMAC | 5.2.0005精密化 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | | |
|
---|
精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 1AIK 解像度: 1.45→42.14 Å / Cor.coef. Fo:Fc: 0.956 / Cor.coef. Fo:Fc free: 0.928 / SU B: 1.818 / SU ML: 0.037 / Isotropic thermal model: Isotropic / 交差検証法: THROUGHOUT / ESU R: 0.061 / ESU R Free: 0.069 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
---|
Rfree | 0.23341 | 917 | 10 % | RANDOM |
---|
Rwork | 0.19191 | - | - | - |
---|
obs | 0.19585 | 8256 | 99.85 % | - |
---|
all | - | 9173 | - | - |
---|
|
---|
溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK |
---|
原子変位パラメータ | Biso mean: 26.142 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
---|
1- | 0.62 Å2 | 0.31 Å2 | 0 Å2 |
---|
2- | - | 0.62 Å2 | 0 Å2 |
---|
3- | - | - | -0.93 Å2 |
---|
|
---|
精密化ステップ | サイクル: LAST / 解像度: 1.45→42.14 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
---|
原子数 | 255 | 0 | 13 | 48 | 316 |
---|
|
---|
拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
---|
X-RAY DIFFRACTION | r_bond_refined_d0.009 | 0.022 | 270 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.138 | 2.01 | 362 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg4.226 | 5 | 29 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg37.213 | 24.615 | 13 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg12.035 | 15 | 53 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg7.733 | 15 | 2 | X-RAY DIFFRACTION | r_chiral_restr0.073 | 0.2 | 44 | X-RAY DIFFRACTION | r_gen_planes_refined0.005 | 0.02 | 186 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined0.206 | 0.2 | 115 | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined0.301 | 0.2 | 185 | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.13 | 0.2 | 20 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.138 | 0.2 | 47 | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.103 | 0.2 | 11 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it0.784 | 1.5 | 152 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it1.42 | 2 | 239 | X-RAY DIFFRACTION | r_scbond_it2.362 | 3 | 131 | X-RAY DIFFRACTION | r_scangle_it3.846 | 4.5 | 123 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
|
---|
LS精密化 シェル | 解像度: 1.45→1.489 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
---|
Rfree | 0.25 | 72 | - |
---|
Rwork | 0.202 | 568 | - |
---|
obs | - | - | 99.69 % |
---|
|
---|
精密化 TLS | 手法: refined / Origin x: -21.502 Å / Origin y: 6.958 Å / Origin z: -8.623 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
---|
T | -0.0559 Å2 | 0.0044 Å2 | 0.0076 Å2 | - | -0.1179 Å2 | 0.0043 Å2 | - | - | -0.1738 Å2 |
---|
L | 1.0872 °2 | 0.2375 °2 | -0.549 °2 | - | 1.3105 °2 | -0.834 °2 | - | - | 6.0814 °2 |
---|
S | -0.0522 Å ° | 0.1599 Å ° | 0.0426 Å ° | -0.2306 Å ° | 0.0059 Å ° | -0.0361 Å ° | 0.3026 Å ° | 0.1494 Å ° | 0.0463 Å ° |
---|
|
---|