解像度: 2→20 Å / Cor.coef. Fo:Fc: 0.972 / Cor.coef. Fo:Fc free: 0.956 / SU B: 9.47 / SU ML: 0.121 / Isotropic thermal model: TLS and isotropic individual / 交差検証法: THROUGHOUT / ESU R Free: 0.139 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.20407
482
5.4 %
RANDOM
Rwork
0.16241
-
-
-
obs
0.16473
8493
97.86 %
-
all
-
8493
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 34.695 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.81 Å2
0.91 Å2
0 Å2
2-
-
1.81 Å2
0 Å2
3-
-
-
-2.72 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
814
0
20
96
930
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.019
0.022
860
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.885
2.037
1180
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.188
5
116
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
45.512
25.909
22
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.126
15
142
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
31.503
15
2
X-RAY DIFFRACTION
r_chiral_restr
0.121
0.2
150
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
608
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.228
0.2
364
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.32
0.2
592
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.196
0.2
83
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.225
0.2
64
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.159
0.2
14
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.527
2
576
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.656
3
927
X-RAY DIFFRACTION
r_scbond_it
7.393
10
308
X-RAY DIFFRACTION
r_scangle_it
10.286
35
251
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.052 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.339
35
-
Rwork
0.241
646
-
obs
-
-
98.7 %
精密化 TLS
手法: refined / Origin x: 2.731 Å / Origin y: 58.8764 Å / Origin z: 30.3144 Å