解像度: 1.8→20 Å / Cor.coef. Fo:Fc: 0.973 / Cor.coef. Fo:Fc free: 0.96 / SU B: 5.596 / SU ML: 0.081 / Isotropic thermal model: TLS and isotropic individual / 交差検証法: THROUGHOUT / ESU R Free: 0.099 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.18794
653
5.3 %
RANDOM
Rwork
0.1611
-
-
-
obs
0.16255
11657
98.19 %
-
all
-
12310
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 33.508 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.28 Å2
0.64 Å2
0 Å2
2-
-
1.28 Å2
0 Å2
3-
-
-
-1.92 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.8→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
821
0
20
102
943
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.02
0.022
865
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.825
2.032
1187
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.928
5
116
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
40.438
26.25
24
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.015
15
143
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
32.157
15
2
X-RAY DIFFRACTION
r_chiral_restr
0.124
0.2
150
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
616
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.216
0.2
349
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.316
0.2
597
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.215
0.2
81
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.158
0.2
53
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.229
0.2
16
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.66
2
576
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
2.516
3
930
X-RAY DIFFRACTION
r_scbond_it
2.632
2
314
X-RAY DIFFRACTION
r_scangle_it
4.429
20
255
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.8→1.847 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.315
48
-
Rwork
0.266
876
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 2.8433 Å / Origin y: 58.7935 Å / Origin z: 30.3424 Å