解像度: 2→50 Å / Cor.coef. Fo:Fc: 0.963 / Cor.coef. Fo:Fc free: 0.947 / SU B: 8.595 / SU ML: 0.119 / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R Free: 0.175 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.24081
433
4.8 %
RANDOM
Rwork
0.18906
-
-
-
all
0.1913
8637
-
-
obs
0.1913
8637
93.69 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 48.787 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-2.08 Å2
-1.04 Å2
0 Å2
2-
-
-2.08 Å2
0 Å2
3-
-
-
3.12 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→50 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
996
0
23
36
1055
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.019
1035
X-RAY DIFFRACTION
r_bond_other_d
0.006
0.02
649
X-RAY DIFFRACTION
r_angle_refined_deg
1.535
1.976
1412
X-RAY DIFFRACTION
r_angle_other_deg
0.991
3
1593
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.799
5
127
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.816
24.667
45
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.691
15
167
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
11.288
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.086
0.2
172
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
1130
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
195
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.052 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.307
33
-
Rwork
0.238
592
-
obs
-
-
95.86 %
精密化 TLS
手法: refined / Origin x: -24.234 Å / Origin y: -12.745 Å / Origin z: -8.408 Å