ソフトウェア | 名称 | バージョン | 分類 |
---|
SBC-Collect | | データ収集 | SHELXD | | 位相決定 | MLPHARE | | 位相決定 | 直接法 | | モデル構築 | ARP | | モデル構築 | WARP | | モデル構築 | HKL-3000 | | 位相決定 | PHENIX | (phenix.refine: 1.7_650)精密化 | HKL-3000 | | データ削減 | HKL-3000 | | データスケーリング | 直接法 | | 位相決定 | |
|
---|
精密化 | 構造決定の手法: 単波長異常分散 / 解像度: 1.201→38.625 Å / SU ML: 0.15 / σ(F): 0 / 位相誤差: 12.92 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 |
---|
Rfree | 0.1616 | 6639 | 5.04 % |
---|
Rwork | 0.1496 | - | - |
---|
obs | 0.1502 | 131748 | 97.42 % |
---|
all | - | 131748 | - |
---|
|
---|
溶媒の処理 | 減衰半径: 0.95 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 46.194 Å2 / ksol: 0.377 e/Å3 |
---|
原子変位パラメータ | | Baniso -1 | Baniso -2 | Baniso -3 |
---|
1- | 0.436 Å2 | 0 Å2 | 0 Å2 |
---|
2- | - | 0.0463 Å2 | -0 Å2 |
---|
3- | - | - | -0.4823 Å2 |
---|
|
---|
精密化ステップ | サイクル: LAST / 解像度: 1.201→38.625 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
---|
原子数 | 2695 | 0 | 11 | 527 | 3233 |
---|
|
---|
拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
---|
X-RAY DIFFRACTION | f_bond_d0.005 | 2927 | X-RAY DIFFRACTION | f_angle_d1.11 | 3991 | X-RAY DIFFRACTION | f_dihedral_angle_d12.049 | 1151 | X-RAY DIFFRACTION | f_chiral_restr0.074 | 448 | X-RAY DIFFRACTION | f_plane_restr0.006 | 522 | | | | | |
|
---|
LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
---|
1.2009-1.2145 | 0.2926 | 170 | 0.2861 | 3303 | X-RAY DIFFRACTION | 78 | 1.2145-1.2288 | 0.2377 | 212 | 0.2708 | 3756 | X-RAY DIFFRACTION | 89 | 1.2288-1.2438 | 0.2556 | 199 | 0.2416 | 3893 | X-RAY DIFFRACTION | 92 | 1.2438-1.2595 | 0.2563 | 211 | 0.2302 | 3983 | X-RAY DIFFRACTION | 93 | 1.2595-1.2761 | 0.2078 | 227 | 0.2146 | 4006 | X-RAY DIFFRACTION | 95 | 1.2761-1.2936 | 0.2118 | 208 | 0.1963 | 4059 | X-RAY DIFFRACTION | 96 | 1.2936-1.3121 | 0.1737 | 200 | 0.1778 | 4099 | X-RAY DIFFRACTION | 97 | 1.3121-1.3316 | 0.1924 | 228 | 0.1679 | 4117 | X-RAY DIFFRACTION | 97 | 1.3316-1.3525 | 0.1626 | 240 | 0.153 | 4117 | X-RAY DIFFRACTION | 97 | 1.3525-1.3746 | 0.1446 | 217 | 0.1491 | 4154 | X-RAY DIFFRACTION | 98 | 1.3746-1.3983 | 0.1484 | 200 | 0.1434 | 4170 | X-RAY DIFFRACTION | 98 | 1.3983-1.4238 | 0.1583 | 222 | 0.1393 | 4223 | X-RAY DIFFRACTION | 99 | 1.4238-1.4512 | 0.14 | 227 | 0.1283 | 4181 | X-RAY DIFFRACTION | 99 | 1.4512-1.4808 | 0.1484 | 225 | 0.1306 | 4170 | X-RAY DIFFRACTION | 99 | 1.4808-1.513 | 0.1477 | 223 | 0.1294 | 4262 | X-RAY DIFFRACTION | 99 | 1.513-1.5482 | 0.1268 | 250 | 0.1275 | 4191 | X-RAY DIFFRACTION | 99 | 1.5482-1.5869 | 0.1376 | 226 | 0.1254 | 4252 | X-RAY DIFFRACTION | 100 | 1.5869-1.6298 | 0.1424 | 256 | 0.1252 | 4241 | X-RAY DIFFRACTION | 100 | 1.6298-1.6777 | 0.1362 | 219 | 0.1269 | 4260 | X-RAY DIFFRACTION | 100 | 1.6777-1.7319 | 0.1494 | 195 | 0.1271 | 4288 | X-RAY DIFFRACTION | 100 | 1.7319-1.7938 | 0.1414 | 223 | 0.1361 | 4282 | X-RAY DIFFRACTION | 100 | 1.7938-1.8656 | 0.1619 | 229 | 0.1395 | 4268 | X-RAY DIFFRACTION | 100 | 1.8656-1.9505 | 0.1576 | 233 | 0.1425 | 4305 | X-RAY DIFFRACTION | 100 | 1.9505-2.0534 | 0.1633 | 204 | 0.1496 | 4302 | X-RAY DIFFRACTION | 100 | 2.0534-2.182 | 0.1464 | 217 | 0.14 | 4317 | X-RAY DIFFRACTION | 100 | 2.182-2.3504 | 0.1758 | 231 | 0.1414 | 4326 | X-RAY DIFFRACTION | 100 | 2.3504-2.5869 | 0.1661 | 228 | 0.1519 | 4337 | X-RAY DIFFRACTION | 100 | 2.5869-2.9612 | 0.1771 | 237 | 0.1638 | 4350 | X-RAY DIFFRACTION | 100 | 2.9612-3.7303 | 0.1454 | 243 | 0.1464 | 4396 | X-RAY DIFFRACTION | 100 | 3.7303-38.6447 | 0.1623 | 239 | 0.1487 | 4501 | X-RAY DIFFRACTION | 98 |
|
---|
精密化 TLS | 手法: refined / Origin x: 21.9011 Å / Origin y: -13.5658 Å / Origin z: -10.0911 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
---|
T | 0.0688 Å2 | -0.0073 Å2 | -0.0004 Å2 | - | 0.0778 Å2 | 0.0039 Å2 | - | - | 0.0726 Å2 |
---|
L | 0.4681 °2 | -0.1177 °2 | -0.2564 °2 | - | 0.4676 °2 | 0.1044 °2 | - | - | 0.4874 °2 |
---|
S | 0.0307 Å ° | 0.0303 Å ° | 0.0208 Å ° | -0.0024 Å ° | -0.012 Å ° | 0.009 Å ° | -0.0263 Å ° | -0.0072 Å ° | -0.0095 Å ° |
---|
|
---|
精密化 TLSグループ | Selection details: all |
---|