解像度: 1.35→35 Å / Cor.coef. Fo:Fc: 0.97 / Cor.coef. Fo:Fc free: 0.965 / SU B: 1.543 / SU ML: 0.031 / 交差検証法: THROUGHOUT / σ(I): 0 / ESU R Free: 0.049 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.17427
3118
5 %
RANDOM
Rwork
0.16093
-
-
-
obs
0.16162
58636
98.59 %
-
all
-
59636
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 12.39 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.28 Å2
0 Å2
0 Å2
2-
-
-0.37 Å2
0 Å2
3-
-
-
0.65 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.35→35 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2144
0
31
276
2451
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
2238
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1576
X-RAY DIFFRACTION
r_angle_refined_deg
1.613
1.978
3013
X-RAY DIFFRACTION
r_angle_other_deg
0.927
3
3802
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.13
5
285
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
31.147
22.745
102
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.729
15
365
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.135
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.101
0.2
322
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
2537
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
485
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.915
1.5
1414
X-RAY DIFFRACTION
r_mcbond_other
0.283
1.5
579
X-RAY DIFFRACTION
r_mcangle_it
1.625
2
2239
X-RAY DIFFRACTION
r_scbond_it
2.67
3
824
X-RAY DIFFRACTION
r_scangle_it
4.363
4.5
773
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.35→1.385 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.232
215
-
Rwork
0.218
4181
-
obs
-
-
96.62 %
精密化 TLS
手法: refined / Origin x: 32.7222 Å / Origin y: 28.5324 Å / Origin z: 15.3901 Å