解像度: 2.6→2.7 Å / 冗長度: 6.7 % / Mean I/σ(I) obs: 2 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
CrystalClear
データ収集
PHASER
位相決定
REFMAC
5.5.0109
精密化
HKL-2000
データ削減
HKL-2000
データスケーリング
精密化
構造決定の手法: 分子置換 / 解像度: 2.6→19.89 Å / Cor.coef. Fo:Fc: 0.934 / Cor.coef. Fo:Fc free: 0.902 / SU B: 27.452 / SU ML: 0.284 / 交差検証法: THROUGHOUT / ESU R Free: 0.37 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.29619
325
4.7 %
RANDOM
Rwork
0.23141
-
-
-
obs
0.2344
6530
99.41 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 58.117 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.38 Å2
0 Å2
0 Å2
2-
-
-0.07 Å2
0 Å2
3-
-
-
-0.31 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.6→19.89 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1387
0
33
23
1443
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.022
1462
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.521
2.002
1997
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.53
5
179
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
38.386
24.407
59
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
18.273
15
244
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
22.508
15
7
X-RAY DIFFRACTION
r_chiral_restr
0.088
0.2
228
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
1079
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.483
1.5
893
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.879
2
1452
X-RAY DIFFRACTION
r_scbond_it
1.253
3
569
X-RAY DIFFRACTION
r_scangle_it
2.063
4.5
545
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.599→2.665 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.423
23
-
Rwork
0.302
466
-
obs
-
-
99.8 %
精密化 TLS
手法: refined / Origin x: -4.108 Å / Origin y: 15.821 Å / Origin z: -16.167 Å