解像度: 1.7→36.43 Å / Cor.coef. Fo:Fc: 0.959 / Cor.coef. Fo:Fc free: 0.949 / SU B: 3.208 / SU ML: 0.049 / Isotropic thermal model: isotropic, TLS / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R Free: 0.087 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE
Rfactor
反射数
%反射
Selection details
Rfree
0.168
1542
5.2 %
RANDOM
Rwork
0.14
-
-
-
all
0.141
30143
-
-
obs
0.141
29910
99.2 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 8.13 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.15 Å2
0 Å2
0 Å2
2-
-
-0.17 Å2
0 Å2
3-
-
-
0.32 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.7→36.43 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2116
0
37
344
2497
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.013
0.021
2274
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1545
X-RAY DIFFRACTION
r_angle_refined_deg
1.517
1.974
3113
X-RAY DIFFRACTION
r_angle_other_deg
0.936
3
3748
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.165
5
289
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.86
22.593
108
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
11.454
15
354
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
15.196
15
21
X-RAY DIFFRACTION
r_chiral_restr
0.09
0.2
336
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
2565
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
486
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.698
1.5
1377
X-RAY DIFFRACTION
r_mcbond_other
0.209
1.5
551
X-RAY DIFFRACTION
r_mcangle_it
1.215
2
2243
X-RAY DIFFRACTION
r_scbond_it
1.98
3
897
X-RAY DIFFRACTION
r_scangle_it
3.172
4.5
860
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.7→1.74 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.206
108
-
Rwork
0.163
1947
-
obs
-
-
92.78 %
精密化 TLS
手法: refined / Origin x: 15.304 Å / Origin y: -5.873 Å / Origin z: -24.64 Å