ソフトウェア | 名称 | バージョン | 分類 | NB |
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REFMAC | 5.5.0070精密化 | | PDB_EXTRACT | 3.005 | データ抽出 | | HKL-2000 | | データ収集 | | DENZO | | データ削減 | | SCALEPACK | | データスケーリング | | PHASER | | 位相決定 | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 3GNY 解像度: 1.6→20 Å / Cor.coef. Fo:Fc: 0.964 / Cor.coef. Fo:Fc free: 0.95 / Occupancy max: 1 / Occupancy min: 0.5 / SU B: 4.133 / SU ML: 0.061 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R: 0.088 / ESU R Free: 0.092 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: U VALUES : RESIDUAL ONLY
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.22464 | 213 | 4.7 % | RANDOM |
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Rwork | 0.18601 | - | - | - |
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obs | 0.18777 | 4337 | 99.98 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 20.45 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.14 Å2 | 0 Å2 | 0 Å2 |
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2- | - | 0.61 Å2 | 0 Å2 |
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3- | - | - | -0.76 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.6→20 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 231 | 0 | 14 | 29 | 274 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.018 | 0.022 | 250 | X-RAY DIFFRACTION | r_bond_other_d | | | X-RAY DIFFRACTION | r_angle_refined_deg1.676 | 1.961 | 332 | X-RAY DIFFRACTION | r_angle_other_deg | | | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.896 | 5 | 29 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg20.72 | 18 | 10 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg14.965 | 15 | 35 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg15.449 | 15 | 4 | X-RAY DIFFRACTION | r_chiral_restr0.127 | 0.2 | 32 | X-RAY DIFFRACTION | r_gen_planes_refined0.009 | 0.021 | 185 | X-RAY DIFFRACTION | r_gen_planes_other | | | X-RAY DIFFRACTION | r_nbd_refined | | | X-RAY DIFFRACTION | r_nbd_other | | | X-RAY DIFFRACTION | r_nbtor_refined | | | X-RAY DIFFRACTION | r_nbtor_other | | | X-RAY DIFFRACTION | r_xyhbond_nbd_refined | | | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined | | | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined | | | X-RAY DIFFRACTION | r_symmetry_vdw_other | | | X-RAY DIFFRACTION | r_symmetry_hbond_refined | | | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it1.127 | 1.5 | 148 | X-RAY DIFFRACTION | r_mcbond_other | | | X-RAY DIFFRACTION | r_mcangle_it2.046 | 2 | 232 | X-RAY DIFFRACTION | r_scbond_it3.822 | 3 | 102 | X-RAY DIFFRACTION | r_scangle_it5.472 | 4.5 | 100 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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Refine LS restraints NCS | Dom-ID: 1 / Auth asym-ID: A / Ens-ID: 1 / 数: 231 / Refine-ID: X-RAY DIFFRACTION / Rms dev position: 0 Å タイプ | Weight position |
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loose positional5 | loose thermal10 | | |
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LS精密化 シェル | 解像度: 1.6→1.641 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.22 | 16 | - |
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Rwork | 0.223 | 311 | - |
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obs | - | - | 99.7 % |
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精密化 TLS | 手法: refined / Origin x: -4.2992 Å / Origin y: -10.1723 Å / Origin z: 8.1012 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | 0.06 Å2 | 0.0079 Å2 | -0.004 Å2 | - | 0.0552 Å2 | 0.011 Å2 | - | - | 0.0639 Å2 |
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L | 2.6599 °2 | 1.8041 °2 | 0.0501 °2 | - | 2.8102 °2 | 0.1152 °2 | - | - | 2.5497 °2 |
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S | -0.1167 Å ° | 0.1526 Å ° | -0.0152 Å ° | -0.2601 Å ° | 0.0858 Å ° | 0.084 Å ° | -0.0864 Å ° | -0.1309 Å ° | 0.0309 Å ° |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Auth seq-ID |
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1 | X-RAY DIFFRACTION | 1 | A1 - 30 | 2 | X-RAY DIFFRACTION | 1 | A31 - 6108 | 3 | X-RAY DIFFRACTION | 1 | A33 - 64 | | | |
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