解像度: 2.5→19.98 Å / Cor.coef. Fo:Fc: 0.953 / SU B: 4.628 / SU ML: 0.107 / 交差検証法: THROUGHOUT / ESU R: 0.419 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.198
1266
5.1 %
RANDOM
Rwork
0.16295
-
-
-
obs
0.16295
24970
95.69 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 25.514 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.09 Å2
0.04 Å2
0 Å2
2-
-
0.09 Å2
0 Å2
3-
-
-
-0.13 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.5→19.98 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4388
0
41
320
4749
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.022
4825
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.247
1.959
6628
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.226
5
633
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.96
23.843
216
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
12.994
15
719
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
14.133
15
35
X-RAY DIFFRACTION
r_chiral_restr
0.084
0.2
738
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.02
3812
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.207
0.2
2300
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.304
0.2
3289
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.137
0.2
383
X-RAY DIFFRACTION
r_xyhbond_nbd_other
0.012
0.2
1
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.168
0.2
47
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.209
0.2
21
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.54
1.5
3126
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.941
2
4961
X-RAY DIFFRACTION
r_scbond_it
1.401
3
1940
X-RAY DIFFRACTION
r_scangle_it
2.269
4.5
1667
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.499→2.563 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rwork
0.193
1800
-
Rfree
-
0
-
obs
-
-
97.14 %
精密化 TLS
手法: refined / Origin x: 15.698 Å / Origin y: 64.808 Å / Origin z: -0.249 Å