THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH ...THE CONSTRUCT WAS EXPRESSED WITH A PURIFICATION TAG MGSDKIHHHHHHENLYFQG. THE TAG WAS REMOVED WITH TEV PROTEASE LEAVING ONLY A GLYCINE (0) FOLLOWED BY THE TARGET SEQUENCE.
モノクロメーター: Single crystal Si(111) bent monochromator (horizontal focusing) プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
相対比: 1
反射
解像度: 2.4→29.579 Å / Num. obs: 12857 / % possible obs: 99.7 % / Observed criterion σ(I): -3 / Biso Wilson estimate: 36.482 Å2 / Rmerge(I) obs: 0.119
反射 シェル
解像度 (Å)
Rmerge(I) obs
Mean I/σ(I) obs
Num. measured obs
Num. unique obs
Diffraction-ID
% possible all
2.4-2.49
0.525
2.7
9695
2601
1
99.3
2.49-2.58
0.482
3.8
11407
2262
1
99.4
2.58-2.7
0.388
5
14551
2539
1
99.8
2.7-2.84
0.3
6.1
13944
2425
1
99.8
2.84-3.02
0.219
7.8
14526
2517
1
99.6
3.02-3.25
0.163
10
14315
2482
1
99.9
3.25-3.58
0.118
13.1
14497
2518
1
99.8
3.58-4.09
0.081
17
14187
2464
1
99.9
4.09-5.14
0.067
19.7
14367
2494
1
99.8
5.14-29.579
0.056
21.9
14630
2541
1
99.5
-
位相決定
位相決定
手法: 単波長異常分散
-
解析
ソフトウェア
名称
バージョン
分類
NB
REFMAC
5.2.0019
精密化
PHENIX
精密化
SHELX
位相決定
MolProbity
3beta29
モデル構築
XSCALE
データスケーリング
PDB_EXTRACT
3.004
データ抽出
XDS
データ削減
SHELXD
位相決定
autoSHARP
位相決定
精密化
構造決定の手法: 単波長異常分散 / 解像度: 2.4→29.579 Å / Cor.coef. Fo:Fc: 0.962 / Cor.coef. Fo:Fc free: 0.928 / SU B: 12.405 / SU ML: 0.153 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.326 / ESU R Free: 0.221 立体化学のターゲット値: MAXIMUM LIKELIHOOD WITH PHASES 詳細: (1). HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. (2). A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN ...詳細: (1). HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. (2). A MET-INHIBITION PROTOCOL WAS USED FOR SELENOMETHIONINE INCORPORATION DURING PROTEIN EXPRESSION. THE OCCUPANCY OF THE SE ATOMS IN THE MSE RESIDUES WAS REDUCED TO 0.75 TO ACCOUNT FOR THE REDUCED SCATTERING POWER DUE TO PARTIAL S-MET INCORPORATION. (3). ATOM RECORD CONTAINS RESIDUAL B FACTORS ONLY. (4). THE PRESENCE OF ZINC AND IRON WERE CONFIRMED BY X-RAY FLUORESCENCE EXCITATION AND WAVELENGTH SCANS. THE METAL IDENTITY AT THE INDIVIDUAL ZN AND FE SITES WAS BASED ON ANOMALOUS DIFFERENCE FOURIER MAP COMPARISONS WITH DATA COLLECTED ABOVE AND BELOW THE FOLLOWING K ABSORPTION EDGES: FE AND ZN. (5). AN ACETATE (ACT) ION WAS MODELED BASED ON CRYSTALLIZATION CONDITION. (6). PO4 IONS WERE MODELED BASED ON THE ELECTRON DENSITY, COORDINATION GEOMETRY.
Rfactor
反射数
%反射
Selection details
Rfree
0.207
626
4.9 %
RANDOM
Rwork
0.149
-
-
-
obs
0.152
12839
99.89 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 24.211 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.95 Å2
0.48 Å2
0 Å2
2-
-
0.95 Å2
0 Å2
3-
-
-
-1.43 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.4→29.579 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2154
0
17
103
2274
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.014
0.021
2269
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
1485
X-RAY DIFFRACTION
r_angle_refined_deg
1.47
1.951
3101
X-RAY DIFFRACTION
r_angle_other_deg
0.943
3
3618
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.906
5
297
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.641
23.529
102
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.435
15
352
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
20.646
15
20
X-RAY DIFFRACTION
r_chiral_restr
0.075
0.2
351
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
2610
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
453
X-RAY DIFFRACTION
r_nbd_refined
0.2
0.2
489
X-RAY DIFFRACTION
r_nbd_other
0.199
0.2
1593
X-RAY DIFFRACTION
r_nbtor_refined
0.17
0.2
1135
X-RAY DIFFRACTION
r_nbtor_other
0.088
0.2
1217
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.181
0.2
115
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.172
0.2
19
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.18
0.2
25
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.128
0.2
14
X-RAY DIFFRACTION
r_mcbond_it
2.122
3
1572
X-RAY DIFFRACTION
r_mcbond_other
0.436
3
594
X-RAY DIFFRACTION
r_mcangle_it
3.087
5
2344
X-RAY DIFFRACTION
r_scbond_it
5.557
8
871
X-RAY DIFFRACTION
r_scangle_it
7.63
11
757
LS精密化 シェル
解像度: 2.4→2.462 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.301
44
-
Rwork
0.187
906
-
all
-
950
-
obs
-
-
99.79 %
精密化 TLS
手法: refined / Origin x: 28.9331 Å / Origin y: 28.6887 Å / Origin z: 7.3071 Å