ソフトウェア | 名称 | バージョン | 分類 | NB |
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DENZO | | データ削減 | | SCALEPACK | | データスケーリング | | REFMAC | | 精密化 | | PDB_EXTRACT | 3.006 | データ抽出 | | MAR345dtb | | データ収集 | | FFT | difference fourier位相決定 | | |
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精密化 | 解像度: 1.8→32.65 Å / Cor.coef. Fo:Fc: 0.961 / Cor.coef. Fo:Fc free: 0.946 / Occupancy max: 1 / Occupancy min: 0.5 / FOM work R set: 0.887 / SU B: 4.189 / SU ML: 0.073 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.125 / ESU R Free: 0.12 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.201 | 1438 | 5.1 % | RANDOM |
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Rwork | 0.16 | - | - | - |
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obs | 0.162 | 28439 | 99.37 % | - |
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all | - | 28439 | - | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso max: 64.51 Å2 / Biso mean: 21.087 Å2 / Biso min: 8.3 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.2 Å2 | 0 Å2 | -0.74 Å2 |
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2- | - | 0.21 Å2 | 0 Å2 |
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3- | - | - | -0.98 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 1.8→32.65 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2423 | 0 | 50 | 350 | 2823 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.012 | 0.022 | 2538 | X-RAY DIFFRACTION | r_angle_refined_deg1.361 | 1.975 | 3409 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg4.891 | 5 | 300 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg37.402 | 25.433 | 127 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg13.525 | 15 | 467 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg8.693 | 15 | 10 | X-RAY DIFFRACTION | r_chiral_restr0.082 | 0.2 | 348 | X-RAY DIFFRACTION | r_gen_planes_refined0.006 | 0.02 | 1923 | X-RAY DIFFRACTION | r_nbd_refined0.204 | 0.2 | 1274 | X-RAY DIFFRACTION | r_nbtor_refined0.306 | 0.2 | 1757 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.14 | 0.2 | 268 | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.188 | 0.2 | 26 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.229 | 0.2 | 22 | X-RAY DIFFRACTION | r_mcbond_it0.902 | 1.5 | 1539 | X-RAY DIFFRACTION | r_mcangle_it1.41 | 2 | 2422 | X-RAY DIFFRACTION | r_scbond_it2.472 | 3 | 1126 | X-RAY DIFFRACTION | r_scangle_it3.872 | 4.5 | 985 | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.8→1.847 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.251 | 111 | - |
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Rwork | 0.169 | 1909 | - |
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all | - | 2020 | - |
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obs | - | - | 96.88 % |
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精密化 TLS | 手法: refined / Origin x: -5.7044 Å / Origin y: 3.9958 Å / Origin z: 12.6842 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | -0.0627 Å2 | 0.0007 Å2 | 0.0153 Å2 | - | -0.0633 Å2 | 0.0015 Å2 | - | - | -0.0352 Å2 |
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L | 0.7793 °2 | 0.0012 °2 | 0.6556 °2 | - | 0.446 °2 | 0.2303 °2 | - | - | 1.9017 °2 |
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S | -0.0045 Å ° | 0.1074 Å ° | 0.0082 Å ° | -0.0106 Å ° | -0.0201 Å ° | 0.015 Å ° | -0.0419 Å ° | 0.1279 Å ° | 0.0247 Å ° |
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