解像度: 1.95→31.51 Å / Cor.coef. Fo:Fc: 0.958 / Cor.coef. Fo:Fc free: 0.925 / SU B: 6.675 / SU ML: 0.105 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.143 / ESU R Free: 0.146 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS. ADDITIONAL DENSITY IN THE ACTIVE SITE, PROBABLY UNIDENTIFIED ENDOGENOUS SUBSTRATE, WAS MODELLED AS A SET OF UNKNOWN (UNX) ATOMS.
Rfactor
反射数
%反射
Selection details
Rfree
0.22033
2441
5 %
RANDOM
Rwork
0.16095
-
-
-
all
0.16398
45963
-
-
obs
0.16398
45963
97.88 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 13.974 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.26 Å2
0 Å2
0 Å2
2-
-
-0.55 Å2
0 Å2
3-
-
-
0.81 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.95→31.51 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4150
0
61
763
4974
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.017
0.022
4391
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
2980
X-RAY DIFFRACTION
r_angle_refined_deg
1.555
1.97
5986
X-RAY DIFFRACTION
r_angle_other_deg
0.989
3
7308
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.312
5
558
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.695
24.426
183
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.532
15
754
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.191
15
23
X-RAY DIFFRACTION
r_chiral_restr
0.094
0.2
663
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.021
4849
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
850
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
3.048
3
2711
X-RAY DIFFRACTION
r_mcbond_other
1.031
3
1097
X-RAY DIFFRACTION
r_mcangle_it
4.216
5
4395
X-RAY DIFFRACTION
r_scbond_it
6.747
7
1680
X-RAY DIFFRACTION
r_scangle_it
8.845
11
1580
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.95→2 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.296
184
-
Rwork
0.219
3127
-
obs
-
-
92.15 %
精密化 TLS
手法: refined / Origin x: 23.9408 Å / Origin y: -9.3816 Å / Origin z: -17.9111 Å