解像度: 2.8→20 Å / Cor.coef. Fo:Fc: 0.914 / Cor.coef. Fo:Fc free: 0.905 / SU B: 15.462 / SU ML: 0.26 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R Free: 0.37 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23431
912
5.2 %
RANDOM
Rwork
0.22581
-
-
-
obs
0.22625
16736
96.57 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 22.656 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.91 Å2
0 Å2
3.25 Å2
2-
-
-0.31 Å2
0 Å2
3-
-
-
1.06 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.8→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
4786
0
130
100
5016
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.022
5004
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.223
2.003
6793
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
13.505
5
634
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.772
25.08
187
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
20.052
15
850
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
20.419
15
19
X-RAY DIFFRACTION
r_chiral_restr
0.089
0.2
774
X-RAY DIFFRACTION
r_gen_planes_refined
0.003
0.02
3652
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.225
0.2
2266
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.312
0.2
3427
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.17
0.2
162
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.125
0.2
27
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.47
1.5
3209
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.732
2
5048
X-RAY DIFFRACTION
r_scbond_it
0.885
3
2098
X-RAY DIFFRACTION
r_scangle_it
1.448
4.5
1745
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.8→2.871 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.343
66
-
Rwork
0.312
1225
-
obs
-
-
95.77 %
精密化 TLS
手法: refined / Origin x: -2.289 Å / Origin y: -9.285 Å / Origin z: 30.071 Å