ソフトウェア 名称 バージョン 分類 ADSCQuantumデータ収集 PHASER位相決定 REFMAC5.5.0109精密化 HKL-2000データ削減 HKL-2000データスケーリング
精密化 構造決定の手法 : 分子置換開始モデル : PDB ENTRY 3B1N解像度 : 2.1→42.68 Å / Cor.coef. Fo :Fc : 0.92 / Cor.coef. Fo :Fc free : 0.886 / SU B : 13.86 / SU ML : 0.185 / 交差検証法 : THROUGHOUT / ESU R Free : 0.233 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.27663 1669 4.9 % RANDOM Rwork 0.23574 - - - obs 0.23779 32351 95.81 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.4 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 36.876 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.01 Å2 0 Å2 0 Å2 2- - 0.01 Å2 0 Å2 3- - - -0.02 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.1→42.68 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 4706 0 0 194 4900
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.009 0.021 4803 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.223 1.953 6510 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg5.69 5 614 X-RAY DIFFRACTION r_dihedral_angle_2_deg34.378 23.392 227 X-RAY DIFFRACTION r_dihedral_angle_3_deg17.18 15 763 X-RAY DIFFRACTION r_dihedral_angle_4_deg17.311 15 41 X-RAY DIFFRACTION r_chiral_restr0.08 0.2 715 X-RAY DIFFRACTION r_gen_planes_refined0.005 0.021 3728 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.29 1.5 3039 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it0.515 2 4843 X-RAY DIFFRACTION r_scbond_it0.97 3 1764 X-RAY DIFFRACTION r_scangle_it1.481 4.5 1667 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.1→2.154 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.314 132 - Rwork 0.285 2193 - obs - - 90.26 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 6) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 0.5177 -0.3843 0.5002 1.9881 -3.6568 7.3137 -0.0575 -0.0345 0.103 0.1781 0.3007 0.1661 -0.6828 -0.6579 -0.2433 0.3028 0.0674 -0.0493 0.1957 0.0076 0.1965 -20.7254 38.4253 -26.8175 2 2.2248 0.482 0.0421 1.4624 0.403 1.3629 -0.001 0.0032 -0.1632 -0.0685 0.0103 -0.0236 -0.0459 -0.0022 -0.0093 0.0625 0.026 -0.0027 0.1502 0.0129 0.1259 -15.4262 19.9326 -17.7859 3 4.6016 0.5505 0.1194 3.1248 0.9796 3.4295 0.0339 -0.1029 -0.0976 0.0443 -0.0702 0.3079 -0.1008 -0.2504 0.0363 0.0087 0.0325 -0.0021 0.225 -0.0061 0.1315 -34.066 20.1554 -14.2449 4 0.6157 -1.9709 0.5766 7.6226 0.446 4.8494 -0.1123 -0.0345 0.1655 0.0144 0.1737 -0.7571 -0.4104 0.1357 -0.0614 0.39 -0.0183 0.0148 0.2203 0.0268 0.2625 -13.0582 39.5139 -29.3384 5 0.4182 -0.2933 0.2321 0.9492 -0.7465 0.7538 -0.0218 -0.2053 0.042 0.5567 -0.0321 -0.2138 -0.4013 0.1889 0.0539 0.653 -0.0977 -0.0503 0.3167 -0.0541 0.3206 -7.8642 63.7736 -21.4104 6 3.5711 0.1237 -0.4925 7.2491 -0.3146 1.042 0.1267 0.3369 0.3807 -0.4149 -0.1269 -0.3677 -0.1094 0.2652 0.0002 0.5811 -0.1941 0.0136 0.5992 -0.0355 0.3778 6.4519 65.9527 -32.8682
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 A2 - 45 2 X-RAY DIFFRACTION 2 A46 - 221 3 X-RAY DIFFRACTION 3 A222 - 314 4 X-RAY DIFFRACTION 4 B2 - 45 5 X-RAY DIFFRACTION 5 B46 - 219 6 X-RAY DIFFRACTION 6 B220 - 304