プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.5418 Å / 相対比: 1
反射
解像度: 2→20 Å / Num. obs: 12160
-
解析
ソフトウェア
名称: REFMAC / バージョン: 5.6.0085 / 分類: 精密化
精密化
構造決定の手法: 分子置換 / 解像度: 2→20 Å / Cor.coef. Fo:Fc: 0.954 / Cor.coef. Fo:Fc free: 0.932 / SU B: 6.269 / SU ML: 0.102 / 交差検証法: THROUGHOUT / ESU R Free: 0.158 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT
Rfactor
反射数
%反射
Selection details
Rfree
0.20455
578
4.8 %
RANDOM
Rwork
0.16013
-
-
-
obs
0.16229
11476
100 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 20.375 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.05 Å2
0 Å2
0 Å2
2-
-
-0.82 Å2
0 Å2
3-
-
-
0.87 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1392
0
5
263
1660
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.021
1438
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.02
963
X-RAY DIFFRACTION
r_angle_refined_deg
1.091
1.937
1954
X-RAY DIFFRACTION
r_angle_other_deg
0.813
3
2324
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.121
5
174
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.943
23.784
74
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.4
15
207
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
11.069
15
7
X-RAY DIFFRACTION
r_chiral_restr
0.07
0.2
193
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.021
1650
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
321
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.051 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.311
36
-
Rwork
0.171
819
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 1.3733 Å / Origin y: -11.8568 Å / Origin z: -4.699 Å