ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.2.0005精密化 | HKL-2000 | | データ収集 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | PHASER | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: 1XGE 解像度: 1.85→40 Å / Cor.coef. Fo:Fc: 0.962 / Cor.coef. Fo:Fc free: 0.941 / SU B: 6.809 / SU ML: 0.111 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.15 / ESU R Free: 0.148 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.24546 | 1430 | 5.1 % | RANDOM |
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Rwork | 0.19118 | - | - | - |
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obs | 0.19379 | 28254 | 95.9 % | - |
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all | - | 28254 | - | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK |
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原子変位パラメータ | Biso mean: 51.878 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | -0.11 Å2 | -0.05 Å2 | 0 Å2 |
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2- | - | -0.11 Å2 | 0 Å2 |
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3- | - | - | 0.16 Å2 |
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Refine analyze | Luzzati coordinate error obs: 0.15 Å |
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精密化ステップ | サイクル: LAST / 解像度: 1.85→40 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 2611 | 0 | 2 | 136 | 2749 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.014 | 0.022 | 2615 | X-RAY DIFFRACTION | r_bond_other_d0.001 | 0.02 | 2397 | X-RAY DIFFRACTION | r_angle_refined_deg1.51 | 1.961 | 3563 | X-RAY DIFFRACTION | r_angle_other_deg0.873 | 3 | 5534 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.835 | 5 | 328 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg32.978 | 23.475 | 118 | X-RAY DIFFRACTION | r_dihedral_angle_3_deg12.628 | 15 | 410 | X-RAY DIFFRACTION | r_dihedral_angle_4_deg18.002 | 15 | 19 | X-RAY DIFFRACTION | r_chiral_restr0.097 | 0.2 | 409 | X-RAY DIFFRACTION | r_gen_planes_refined0.006 | 0.02 | 2932 | X-RAY DIFFRACTION | r_gen_planes_other0.001 | 0.02 | 535 | X-RAY DIFFRACTION | r_nbd_refined0.214 | 0.2 | 539 | X-RAY DIFFRACTION | r_nbd_other0.175 | 0.2 | 2470 | X-RAY DIFFRACTION | r_nbtor_refined0.179 | 0.2 | 1303 | X-RAY DIFFRACTION | r_nbtor_other0.084 | 0.2 | 1526 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.143 | 0.2 | 115 | X-RAY DIFFRACTION | r_xyhbond_nbd_other | | | X-RAY DIFFRACTION | r_metal_ion_refined0.11 | 0.2 | 5 | X-RAY DIFFRACTION | r_metal_ion_other | | | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.178 | 0.2 | 7 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.235 | 0.2 | 37 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.121 | 0.2 | 5 | X-RAY DIFFRACTION | r_symmetry_hbond_other | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_refined | | | X-RAY DIFFRACTION | r_symmetry_metal_ion_other | | | X-RAY DIFFRACTION | r_mcbond_it4.738 | 4 | 2121 | X-RAY DIFFRACTION | r_mcbond_other1.694 | 4 | 661 | X-RAY DIFFRACTION | r_mcangle_it5.193 | 6 | 2665 | X-RAY DIFFRACTION | r_scbond_it4.786 | 4 | 1087 | X-RAY DIFFRACTION | r_scangle_it6.227 | 6 | 898 | X-RAY DIFFRACTION | r_rigid_bond_restr | | | X-RAY DIFFRACTION | r_sphericity_free | | | X-RAY DIFFRACTION | r_sphericity_bonded | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 1.85→1.9 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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Rfree | 0.316 | 107 | - |
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Rwork | 0.247 | 1843 | - |
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obs | - | 1950 | 91.25 % |
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精密化 TLS | 手法: refined / Origin x: -6.2346 Å / Origin y: 12.6643 Å / Origin z: 17.7524 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
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T | -0.2223 Å2 | 0.0279 Å2 | 0.0342 Å2 | - | -0.2783 Å2 | 0.0188 Å2 | - | - | -0.2649 Å2 |
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L | 2.1226 °2 | -1.0354 °2 | 1.2208 °2 | - | 2.3061 °2 | -0.6092 °2 | - | - | 3.1508 °2 |
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S | -0.2218 Å ° | -0.074 Å ° | 0.0509 Å ° | 0.2558 Å ° | 0.0139 Å ° | -0.1009 Å ° | -0.2329 Å ° | 0.2261 Å ° | 0.2079 Å ° |
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