モノクロメーター: Si single crystal / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 0.8128 Å / 相対比: 1
反射
解像度: 1.54→15 Å / Num. obs: 64545 / % possible obs: 100 % / Observed criterion σ(I): -3 / 冗長度: 24.4 % / Biso Wilson estimate: 26.31 Å2 / Rmerge(I) obs: 0.05 / Net I/σ(I): 72.5
反射 シェル
解像度: 1.54→1.57 Å / 冗長度: 17.8 % / Rmerge(I) obs: 0.802 / Mean I/σ(I) obs: 3.8 / Num. unique all: 3171 / % possible all: 100
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解析
ソフトウェア
名称
バージョン
分類
NB
DENZO
データ削減
SCALEPACK
データスケーリング
REFMAC
精密化
PDB_EXTRACT
2
データ抽出
MOLREP
位相決定
精密化
構造決定の手法: 分子置換 / 解像度: 1.54→15 Å / Cor.coef. Fo:Fc: 0.97 / Cor.coef. Fo:Fc free: 0.967 / SU B: 2.551 / SU ML: 0.047 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.066 / ESU R Free: 0.065 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: THE REFINEMENT INCLUDED TLS PARAMETERS. RESIDUES 179-190, 245-255, 305-306 AND 318-330 WERE NOT MODELED DUE TO LACK OF ELECTRON DENSITY. THERE WAS NO OBSERVED ELECTRON DENSITY FOR SIDE CHAIN ...詳細: THE REFINEMENT INCLUDED TLS PARAMETERS. RESIDUES 179-190, 245-255, 305-306 AND 318-330 WERE NOT MODELED DUE TO LACK OF ELECTRON DENSITY. THERE WAS NO OBSERVED ELECTRON DENSITY FOR SIDE CHAIN ATOMS OF RESIDUES 118, 119, 149, 177, 178, 191, 192, 193, 215, 218, 227, 244, 256, 257, 258, 259, 304, 307, 310. THOSE ATOMS WERE MODELED WITH ZERO OCCUPANCY AND B-FACTOR OF 70 A2.
Rfactor
反射数
%反射
Selection details
Rfree
0.197
1270
2.031 %
RANDOM
Rwork
0.182
-
-
-
obs
0.183
62469
96.8 %
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all
-
62474
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK