| ソフトウェア | | 名称 | 分類 |
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| WEIS | データ収集 | | Agrovata | データ削減 | X-PLOR | モデル構築 | X-PLOR | 精密化 | | WEIS | データ削減 | | Agrovata | データスケーリング | X-PLOR | 位相決定 |
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| 精密化 | 構造決定の手法: 多重同系置換, 分子置換 開始モデル: SOYBEAN TRYPSIN INHIBITOR 解像度: 1.8→15 Å / σ(F): 0 / | Rfactor | 反射数 | %反射 |
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| Rwork | 0.19 | - | - |
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| obs | 0.19 | 15159 | 80 % |
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| 原子変位パラメータ | Biso mean: 9.5 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | 9.5 Å2 | 9.5 Å2 | 9.5 Å2 |
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| 2- | - | 9.5 Å2 | 9.5 Å2 |
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| 3- | - | - | 9.5 Å2 |
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| Refine analyze | Luzzati coordinate error obs: 0.2 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 1.8→15 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 1311 | 0 | 0 | 87 | 1398 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.008 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 1.531 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d| 24.87 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d| 1.207 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 1.8→2 Å / | Rfactor | 反射数 | %反射 |
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| Rwork | 0.221 | 2156 | - |
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| obs | - | - | 43 % |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | PARAM19.SOL| TOPH19.SOL | | | |
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| ソフトウェア | *PLUS 名称: X-PLOR / 分類: refinement |
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| 精密化 | *PLUS Rfactor obs: 0.19 / Rfactor Rwork: 0.19 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 24.874 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.207 | | | | |
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