ソフトウェア | 名称 | バージョン | 分類 |
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REFMAC | 5.1.07精密化 | MAR345 | | データ収集 | XDS | | データスケーリング | AMoRE | | 位相決定 | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: EDA-A1 trimer containing residues 248-307, 319-333, 347-390 解像度: 2.23→30 Å / Cor.coef. Fo:Fc: 0.928 / Cor.coef. Fo:Fc free: 0.892 / SU B: 7.362 / SU ML: 0.184 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.48 / ESU R Free: 0.252 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.24052 | 3700 | 9.9 % | THIN SHELLS |
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Rwork | 0.20009 | - | - | - |
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all | 0.2043 | 37233 | - | - |
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obs | 0.2043 | 33523 | 97.25 % | - |
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溶媒の処理 | イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK |
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原子変位パラメータ | Biso mean: 6.364 Å2
| Baniso -1 | Baniso -2 | Baniso -3 |
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1- | 0.26 Å2 | 0 Å2 | 0.55 Å2 |
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2- | - | -0.61 Å2 | 0 Å2 |
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3- | - | - | 0.64 Å2 |
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精密化ステップ | サイクル: LAST / 解像度: 2.23→30 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 6594 | 0 | 0 | 182 | 6776 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | Dev ideal target | 数 |
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X-RAY DIFFRACTION | r_bond_refined_d0.007 | 0.022 | 6738 | X-RAY DIFFRACTION | r_bond_other_d0.002 | 0.02 | 6066 | X-RAY DIFFRACTION | r_angle_refined_deg1.159 | 1.94 | 9120 | X-RAY DIFFRACTION | r_angle_other_deg0.757 | 3 | 14124 | X-RAY DIFFRACTION | r_dihedral_angle_1_deg6.762 | 5 | 828 | X-RAY DIFFRACTION | r_dihedral_angle_2_deg12.419 | 15 | 1140 | X-RAY DIFFRACTION | r_chiral_restr0.07 | 0.2 | 1038 | X-RAY DIFFRACTION | r_gen_planes_refined0.003 | 0.02 | 7404 | X-RAY DIFFRACTION | r_gen_planes_other0.002 | 0.02 | 1380 | X-RAY DIFFRACTION | r_nbd_refined0.236 | 0.2 | 1123 | X-RAY DIFFRACTION | r_nbd_other0.243 | 0.2 | 7226 | X-RAY DIFFRACTION | r_nbtor_other0.08 | 0.2 | 3670 | X-RAY DIFFRACTION | r_xyhbond_nbd_refined0.158 | 0.2 | 235 | X-RAY DIFFRACTION | r_symmetry_vdw_refined0.292 | 0.2 | 36 | X-RAY DIFFRACTION | r_symmetry_vdw_other0.286 | 0.2 | 155 | X-RAY DIFFRACTION | r_symmetry_hbond_refined0.171 | 0.2 | 17 | X-RAY DIFFRACTION | r_mcbond_it1.189 | 5 | 4158 | X-RAY DIFFRACTION | r_mcangle_it1.826 | 6 | 6732 | X-RAY DIFFRACTION | r_scbond_it1.799 | 6 | 2580 | X-RAY DIFFRACTION | r_scangle_it2.644 | 8 | 2388 | | | | | | | | | | | | | | | | | | | | |
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LS精密化 シェル | 解像度: 2.233→2.279 Å / Total num. of bins used: 25 / | Rfactor | 反射数 |
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Rfree | 0.25 | 374 |
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Rwork | 0.208 | 2095 |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 2.1653 | 0.4866 | 0.1845 | 1.694 | 0.3842 | 3.4624 | -0.0603 | 0.2328 | -0.0441 | -0.064 | 0.0356 | -0.0471 | 0.1826 | 0.0844 | 0.0247 | 0.0318 | 0.0041 | 0.0163 | 0.0882 | 0.0241 | 0.0609 | 16.791 | 5.563 | 9.96 | 2 | 1.7492 | 0.5341 | 0.0629 | 5.2261 | 2.3682 | 4.4557 | -0.0213 | -0.1079 | -0.1946 | -0.0223 | 0.0416 | 0.0771 | 0.3422 | -0.0055 | -0.0203 | 0.0631 | 0.0145 | 0.0042 | 0.081 | 0.0638 | 0.082 | 7.741 | -9.913 | 23.913 | 3 | 3.8682 | 0.8543 | 1.9145 | 1.3248 | -0.0089 | 2.9229 | 0.0058 | -0.0839 | 0.1887 | 0.0355 | -0.0407 | 0.1108 | -0.3301 | -0.1603 | 0.0349 | 0.0486 | 0.0301 | 0.0555 | 0.0637 | 0.0185 | 0.0689 | -3.802 | 8.464 | 18.542 | 4 | 3.9337 | 0.0931 | 1.3479 | 3.5158 | -0.2705 | 4.196 | -0.1189 | -0.0265 | 0.2179 | 0.0957 | 0.1089 | 0.5859 | -0.1277 | -0.3166 | 0.01 | 0.0727 | -0.0153 | 0.0071 | 0.0653 | 0.0082 | 0.2531 | 13.472 | 33.057 | 8.422 | 5 | 3.5124 | -0.5349 | 0.3209 | 6.3322 | -0.849 | 3.4004 | 0.0282 | -0.021 | 0.1229 | 0.1388 | 0.0093 | -0.1497 | -0.2132 | 0.2391 | -0.0374 | 0.1738 | -0.0227 | 0.0299 | 0.067 | -0.0594 | 0.1231 | 27.687 | 50.684 | 8.286 | 6 | 2.8886 | -1.5183 | 1.0507 | 4.682 | -1.1701 | 4.4393 | 0.2117 | 0.3207 | -0.1589 | -0.5559 | -0.1216 | -0.0724 | 0.246 | 0.1908 | -0.09 | 0.1145 | 0.0043 | 0.0075 | 0.0984 | -0.0567 | 0.1824 | 33.65 | 31.845 | -2.257 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Auth asym-ID | Label asym-ID | Auth seq-ID | Label seq-ID |
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1 | X-RAY DIFFRACTION | 1 | AA248 - 389 | 23 - 162 | 2 | X-RAY DIFFRACTION | 2 | BB248 - 389 | 23 - 162 | 3 | X-RAY DIFFRACTION | 3 | DC248 - 389 | 23 - 162 | 4 | X-RAY DIFFRACTION | 4 | ED248 - 389 | 23 - 162 | 5 | X-RAY DIFFRACTION | 5 | FE248 - 389 | 23 - 162 | 6 | X-RAY DIFFRACTION | 6 | GF248 - 389 | 23 - 162 | | | | | | | | | | | | |
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精密化 | *PLUS 最低解像度: 30 Å / % reflection Rfree: 10 % / Rfactor Rfree: 0.241 / Rfactor Rwork: 0.2 |
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溶媒の処理 | *PLUS |
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原子変位パラメータ | *PLUS |
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拘束条件 | *PLUS Refine-ID | タイプ | Dev ideal |
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X-RAY DIFFRACTION | r_bond_d0.007 | X-RAY DIFFRACTION | r_angle_d | X-RAY DIFFRACTION | r_angle_deg1.16 | | | |
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