解像度: 3.2→20 Å / Cor.coef. Fo:Fc: 0.85 / Cor.coef. Fo:Fc free: 0.774 / SU B: 32.728 / SU ML: 0.59 / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R Free: 0.625 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.30484
256
4.6 %
RANDOM
Rwork
0.25867
-
-
-
obs
0.26155
5324
100 %
-
all
-
5632
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 19.3 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.85 Å2
0 Å2
-2.22 Å2
2-
-
-2.01 Å2
0 Å2
3-
-
-
1.05 Å2
精密化ステップ
サイクル: LAST / 解像度: 3.2→20 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1628
0
3
233
1864
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.012
0.022
1659
X-RAY DIFFRACTION
r_bond_other_d
0.003
0.02
1480
X-RAY DIFFRACTION
r_angle_refined_deg
1.877
1.954
2264
X-RAY DIFFRACTION
r_angle_other_deg
1.514
3
3469
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
3.775
3
211
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
22.4
15
291
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
X-RAY DIFFRACTION
r_chiral_restr
0.158
0.2
266
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.02
1854
X-RAY DIFFRACTION
r_gen_planes_other
0.007
0.02
294
X-RAY DIFFRACTION
r_nbd_refined
0.332
0.3
540
X-RAY DIFFRACTION
r_nbd_other
0.301
0.3
1904
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.285
0.5
168
X-RAY DIFFRACTION
r_xyhbond_nbd_other
0.221
0.5
11
X-RAY DIFFRACTION
r_metal_ion_refined
0.279
0.5
4
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.248
0.3
21
X-RAY DIFFRACTION
r_symmetry_vdw_other
0.333
0.3
53
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.496
0.5
4
X-RAY DIFFRACTION
r_symmetry_hbond_other
0.178
0.5
1
X-RAY DIFFRACTION
r_mcbond_it
1.134
1.5
1060
X-RAY DIFFRACTION
r_mcangle_it
2.002
2
1735
X-RAY DIFFRACTION
r_scbond_it
2.694
3
599
X-RAY DIFFRACTION
r_scangle_it
4.501
4.5
529
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 3.2→3.281 Å / Total num. of bins used: 20 /
Rfactor
反射数
Rfree
0.376
21
Rwork
0.298
388
精密化 TLS
手法: refined / Origin x: -1.3919 Å / Origin y: 0.6416 Å / Origin z: 26.0387 Å