| ソフトウェア | | 名称 | バージョン | 分類 |
|---|
| DENZO | | データ削減 | | SCALEPACK | | データスケーリング | | SHELXL-96 | | モデル構築 | X-PLOR | 3.843 | 精密化 | | SHELXL-96 | | 位相決定 |
|
|---|
| 精密化 | 構造決定の手法: 多重同系置換 / 解像度: 2.2→6 Å / Rfactor Rfree error: 0.005 / Data cutoff high absF: 10000000 / Data cutoff low absF: 0.001 / Isotropic thermal model: RESTRAINED / 交差検証法: THROUGHOUT / σ(F): 0
| Rfactor | 反射数 | %反射 | Selection details |
|---|
| Rfree | 0.3 | 3147 | 10.2 % | RANDOM |
|---|
| Rwork | 0.218 | - | - | - |
|---|
| obs | 0.218 | 30707 | 99.1 % | - |
|---|
|
|---|
| 原子変位パラメータ | Biso mean: 43 Å2 |
|---|
| Refine analyze | | Free | Obs |
|---|
| Luzzati coordinate error | 0.39 Å | 0.31 Å |
|---|
| Luzzati d res low | - | 6 Å |
|---|
| Luzzati sigma a | 0.41 Å | 0.41 Å |
|---|
|
|---|
| 精密化ステップ | サイクル: LAST / 解像度: 2.2→6 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
|---|
| 原子数 | 2854 | 0 | 0 | 268 | 3122 |
|---|
|
|---|
| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
|---|
| X-RAY DIFFRACTION | x_bond_d| 0.014 | | | X-RAY DIFFRACTION | x_bond_d_na | | | X-RAY DIFFRACTION | x_bond_d_prot | | | X-RAY DIFFRACTION | x_angle_d | | | X-RAY DIFFRACTION | x_angle_d_na | | | X-RAY DIFFRACTION | x_angle_d_prot | | | X-RAY DIFFRACTION | x_angle_deg| 1.8 | | | X-RAY DIFFRACTION | x_angle_deg_na | | | X-RAY DIFFRACTION | x_angle_deg_prot | | | X-RAY DIFFRACTION | x_dihedral_angle_d| 25.5 | | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | | X-RAY DIFFRACTION | x_improper_angle_d| 1.69 | | | X-RAY DIFFRACTION | x_improper_angle_d_na | | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | | X-RAY DIFFRACTION | x_mcbond_it| 3.01 | 1.5 | | X-RAY DIFFRACTION | x_mcangle_it| 4.69 | 2 | | X-RAY DIFFRACTION | x_scbond_it| 5.38 | 2 | | X-RAY DIFFRACTION | x_scangle_it| 8.3 | 2.5 | | | | | | | | | | | | | | | | | | | |
|
|---|
| LS精密化 シェル | 解像度: 2.2→2.33 Å / Rfactor Rfree error: 0.017 / Total num. of bins used: 6
| Rfactor | 反射数 | %反射 |
|---|
| Rfree | 0.398 | 521 | 10.3 % |
|---|
| Rwork | 0.365 | 4529 | - |
|---|
| obs | - | - | 98.6 % |
|---|
|
|---|
| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
|---|
| X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | | | | |
|
|---|
| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.843 / 分類: refinement |
|---|
| 精密化 | *PLUS 最高解像度: 2.2 Å / 最低解像度: 6 Å / Num. reflection obs: 27565 / Rfactor Rfree: 0.301 |
|---|
| 溶媒の処理 | *PLUS |
|---|
| 原子変位パラメータ | *PLUS |
|---|
| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
|---|
| X-RAY DIFFRACTION | x_angle_deg| 1.85 | | X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 25.5 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.69 | | | | | |
|
|---|