ジャーナル: Thesis, University of Leeds / 年: 1997 タイトル: Crystallographic studies of the methionine repressor-operator complex and the oc31 42kDa repressor 著者: Garvie, C.W.
解像度: 2.15→23 Å / Rfactor Rfree error: 0.007 / Data cutoff high absF: 1000000000 / Data cutoff low absF: 0 / 交差検証法: THROUGHOUT / 詳細: BULK SOLVENT MODEL USED
Rfactor
反射数
%反射
Selection details
Rfree
0.223
959
9.9 %
RANDOM
Rwork
0.181
-
-
-
obs
0.181
10402
97.5 %
-
原子変位パラメータ
Biso mean: 30.6 Å2
Refine analyze
Free
Obs
Luzzati coordinate error
0.26 Å
0.22 Å
Luzzati d res low
-
5 Å
Luzzati sigma a
0.25 Å
0.23 Å
精密化ステップ
サイクル: LAST / 解像度: 2.15→23 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1690
0
5
112
1807
拘束条件
Refine-ID
タイプ
Dev ideal
X-RAY DIFFRACTION
x_bond_d
0.007
X-RAY DIFFRACTION
x_bond_d_na
X-RAY DIFFRACTION
x_bond_d_prot
X-RAY DIFFRACTION
x_angle_d
X-RAY DIFFRACTION
x_angle_d_na
X-RAY DIFFRACTION
x_angle_d_prot
X-RAY DIFFRACTION
x_angle_deg
1.3
X-RAY DIFFRACTION
x_angle_deg_na
X-RAY DIFFRACTION
x_angle_deg_prot
X-RAY DIFFRACTION
x_dihedral_angle_d
23.9
X-RAY DIFFRACTION
x_dihedral_angle_d_na
X-RAY DIFFRACTION
x_dihedral_angle_d_prot
X-RAY DIFFRACTION
x_improper_angle_d
1.33
X-RAY DIFFRACTION
x_improper_angle_d_na
X-RAY DIFFRACTION
x_improper_angle_d_prot
X-RAY DIFFRACTION
x_mcbond_it
X-RAY DIFFRACTION
x_mcangle_it
X-RAY DIFFRACTION
x_scbond_it
X-RAY DIFFRACTION
x_scangle_it
LS精密化 シェル
解像度: 2.15→2.23 Å / Rfactor Rfree error: 0.032 / Total num. of bins used: 10