| ソフトウェア | | 名称 | バージョン | 分類 |
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| MOSFLM | | データ削減 | | SCALA | | データスケーリング | CCP4 | | データ削減 | | RESOLVE | | モデル構築 | | CNS | | 精密化 | CCP4 | (SCALA)| データスケーリング | | RESOLVE | | 位相決定 | |
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| 精密化 | 構造決定の手法: 多波長異常分散 / 解像度: 2.3→36.22 Å / 交差検証法: THROUGHOUT / σ(F): 0 立体化学のターゲット値: STANDARD CNS DICTIONARY/ENGH AND HUBER 詳細: DISORDERED SIDECHAINS: CHAIN A: 45, 52,72,76,154,170, 179,180,181,197; CHAIN B: 30,31,34,45,52,72, 76, 86,145,154,163,164,170,178,181,197 DISORDERED RESIDUES: CHAIN A: 177,178 CHAIN B: ...詳細: DISORDERED SIDECHAINS: CHAIN A: 45, 52,72,76,154,170, 179,180,181,197; CHAIN B: 30,31,34,45,52,72, 76, 86,145,154,163,164,170,178,181,197 DISORDERED RESIDUES: CHAIN A: 177,178 CHAIN B: 179,180. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS.
| Rfactor | 反射数 | %反射 | Selection details |
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| Rfree | 0.29 | 1500 | 5.1 % | RANDOM |
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| Rwork | 0.251 | - | - | - |
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| obs | 0.251 | 27922 | 99.9 % | - |
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| 溶媒の処理 | 溶媒モデル: BULK SOLVENT MODELLING / Bsol: 322.79 Å2 / ksol: 0.9 e/Å3 |
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| 原子変位パラメータ | | Baniso -1 | Baniso -2 | Baniso -3 |
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| 1- | -1.17 Å2 | 0 Å2 | -0.33 Å2 |
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| 2- | - | 2.81 Å2 | 0 Å2 |
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| 3- | - | - | -1.75 Å2 |
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| Refine analyze | Luzzati coordinate error obs: 0.59 Å / Luzzati d res low obs: 6 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.3→36.22 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 3146 | 0 | 0 | 103 | 3249 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal | Dev ideal target |
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| X-RAY DIFFRACTION | c_bond_d | | | X-RAY DIFFRACTION | c_bond_d_na | | | X-RAY DIFFRACTION | c_bond_d_prot | | | X-RAY DIFFRACTION | c_angle_d | | | X-RAY DIFFRACTION | c_angle_d_na | | | X-RAY DIFFRACTION | c_angle_d_prot | | | X-RAY DIFFRACTION | c_angle_deg | | | X-RAY DIFFRACTION | c_angle_deg_na | | | X-RAY DIFFRACTION | c_angle_deg_prot | | | X-RAY DIFFRACTION | c_dihedral_angle_d | | | X-RAY DIFFRACTION | c_dihedral_angle_d_na | | | X-RAY DIFFRACTION | c_dihedral_angle_d_prot | | | X-RAY DIFFRACTION | c_improper_angle_d | | | X-RAY DIFFRACTION | c_improper_angle_d_na | | | X-RAY DIFFRACTION | c_improper_angle_d_prot | | | X-RAY DIFFRACTION | c_mcbond_it| 1.417 | 1.5 | | X-RAY DIFFRACTION | c_mcangle_it| 2.527 | 2 | | X-RAY DIFFRACTION | c_scbond_it| 1.252 | 2 | | X-RAY DIFFRACTION | c_scangle_it| 2.201 | 2.5 | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.3→2.41 Å / Total num. of bins used: 20
| Rfactor | 反射数 | %反射 |
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| Rfree | 0.4 | 119 | 5 % |
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| Rwork | 0.325 | 2076 | - |
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| obs | - | - | 96 % |
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