解像度: 1.82→40.5 Å / SU B: 5.844 / SU ML: 0.094 / 交差検証法: THROUGHOUT / ESU R: 0.143 / ESU R Free: 0.138 / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.23839
1246
5 %
RANDOM
Rwork
0.19381
-
-
-
obs
0.19381
23575
99.82 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å
原子変位パラメータ
Biso mean: 25.677 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.63 Å2
0.31 Å2
0 Å2
2-
-
0.63 Å2
0 Å2
3-
-
-
-2.04 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.82→40.5 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1922
0
43
251
2216
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
Weight
X-RAY DIFFRACTION
r_bond_refined_d
0.015
0.013
2129
X-RAY DIFFRACTION
r_bond_other_d
0.002
0.017
1983
X-RAY DIFFRACTION
r_angle_refined_deg
2.007
1.663
2893
X-RAY DIFFRACTION
r_angle_other_deg
1.485
1.588
4635
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
16.937
5.336
268
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
29.296
22.9
100
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
15.98
379
15
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
21.307
15
10
X-RAY DIFFRACTION
r_chiral_restr
0.095
0.2
264
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.02
2614
X-RAY DIFFRACTION
r_gen_planes_other
0.002
0.02
442
X-RAY DIFFRACTION
r_mcbond_it
0.929
0.82
1002
X-RAY DIFFRACTION
r_mcbond_other
0.928
0.819
1001
X-RAY DIFFRACTION
r_mcangle_it
1.638
1.225
1256
X-RAY DIFFRACTION
r_mcangle_other
1.638
1.227
1257
X-RAY DIFFRACTION
r_scbond_it
1.384
1.038
1127
X-RAY DIFFRACTION
r_scbond_other
1.179
1
1112
X-RAY DIFFRACTION
r_scangle_it
2.054
1.494
1630
X-RAY DIFFRACTION
r_scangle_other
1.973
1.444
1611
X-RAY DIFFRACTION
r_lrange_it
8.269
12.769
2640
X-RAY DIFFRACTION
r_lrange_other
8.074
11.387
2555
LS精密化 シェル
解像度: 1.82→1.862 Å
Rfactor
反射数
%反射
Rfree
0.276
83
-
Rwork
0.218
-
-
obs
-
-
99.89 %
精密化 TLS
手法: refined / Origin x: 22.6665 Å / Origin y: -10.3404 Å / Origin z: 19.6701 Å