解像度: 2.3→30 Å / Cor.coef. Fo:Fc: 0.948 / Cor.coef. Fo:Fc free: 0.936 / SU B: 13.063 / SU ML: 0.166 / 交差検証法: THROUGHOUT / ESU R Free: 0.225 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT
Rfactor
反射数
%反射
Selection details
Rfree
0.241
2408
5.1 %
RANDOM
Rwork
0.205
-
-
-
obs
0.207
45024
92.8 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 62.32 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.32 Å2
0 Å2
0 Å2
2-
-
-0.32 Å2
0 Å2
3-
-
-
0.63 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.3→30 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
6312
0
288
181
6781
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.016
0.022
6802
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.654
2.037
9293
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.153
5
808
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
40.547
24.516
310
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
18.162
15
1065
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
18.726
15
37
X-RAY DIFFRACTION
r_chiral_restr
0.107
0.2
976
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.021
5241
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
Refine LS restraints NCS
Dom-ID: 1 / Auth asym-ID: A / Refine-ID: X-RAY DIFFRACTION