ソフトウェア 名称 バージョン 分類 REFMAC5.8.0267精密化 HKL-2000データ削減 HKL-2000データスケーリング PHASER位相決定
精密化 構造決定の手法 : 分子置換開始モデル : 5UEE解像度 : 1.64→50 Å / Cor.coef. Fo :Fc : 0.943 / Cor.coef. Fo :Fc free : 0.924 / SU B : 1.864 / SU ML : 0.064 / 交差検証法 : THROUGHOUT / ESU R : 0.114 / ESU R Free : 0.115 / 詳細 : Hydrogens have been added in their riding positionsRfactor 反射数 %反射 Rfree 0.247 569 4.696 % Rwork 0.2079 11547 - all 0.21 - - obs - 12116 87.581 %
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK BULK SOLVENT原子変位パラメータ Biso mean : 18.93 Å2 Baniso -1 Baniso -2 Baniso -3 1- 0.001 Å2 0.001 Å2 0 Å2 2- - 0.001 Å2 -0 Å2 3- - - -0.004 Å2
精密化ステップ サイクル : LAST / 解像度 : 1.64→50 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 0 509 201 112 822
拘束条件 大きな表を表示 (5 x 24) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.023 0.017 792 X-RAY DIFFRACTION r_bond_other_d0.028 0.024 348 X-RAY DIFFRACTION r_angle_refined_deg2.88 2.01 1200 X-RAY DIFFRACTION r_angle_other_deg3.84 3.171 818 X-RAY DIFFRACTION r_chiral_restr0.481 0.2 138 X-RAY DIFFRACTION r_chiral_restr_other1.816 0.2 20 X-RAY DIFFRACTION r_gen_planes_refined0.019 0.021 400 X-RAY DIFFRACTION r_gen_planes_other0.001 0.022 152 X-RAY DIFFRACTION r_nbd_refined0.09 0.2 72 X-RAY DIFFRACTION r_symmetry_nbd_other0.222 0.2 490 X-RAY DIFFRACTION r_nbtor_refined0.252 0.2 311 X-RAY DIFFRACTION r_symmetry_nbtor_other0.244 0.2 175 X-RAY DIFFRACTION r_xyhbond_nbd_refined0.166 0.2 95 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_other0.095 0.2 2 X-RAY DIFFRACTION r_metal_ion_refined0.105 0.2 6 X-RAY DIFFRACTION r_symmetry_nbd_refined0.129 0.2 7 X-RAY DIFFRACTION r_nbd_other0.169 0.2 32 X-RAY DIFFRACTION r_symmetry_xyhbond_nbd_refined0.138 0.2 17 X-RAY DIFFRACTION r_scbond_it2.091 1.923 792 X-RAY DIFFRACTION r_scbond_other2.09 1.923 793 X-RAY DIFFRACTION r_scangle_it2.94 2.897 1200 X-RAY DIFFRACTION r_scangle_other2.939 2.896 1201 X-RAY DIFFRACTION r_lrange_it4.73 17.943 1122 X-RAY DIFFRACTION r_lrange_other4.501 17.125 1086
LS精密化 シェル 大きな表を表示 (7 x 20) 大きな表を隠す 解像度 (Å)Rfactor Rfree Num. reflection Rfree Rfactor Rwork Num. reflection Rwork Refine-ID % reflection obs (%)1.64-1.681 0.315 17 0.214 454 X-RAY DIFFRACTION 47.8659 1.681-1.727 0.209 26 0.194 508 X-RAY DIFFRACTION 53.9939 1.727-1.777 0.223 38 558 X-RAY DIFFRACTION 63.1356 1.777-1.831 0.256 41 0.199 680 X-RAY DIFFRACTION 76.7838 1.831-1.891 0.182 25 822 X-RAY DIFFRACTION 96.25 1.891-1.958 0.218 46 829 X-RAY DIFFRACTION 99.319 1.958-2.032 0.294 20 0.242 814 X-RAY DIFFRACTION 100 2.032-2.114 0.281 40 0.222 769 X-RAY DIFFRACTION 100 2.114-2.208 0.305 41 0.248 730 X-RAY DIFFRACTION 100 2.208-2.316 0.223 35 713 X-RAY DIFFRACTION 100 2.316-2.441 0.328 30 0.206 686 X-RAY DIFFRACTION 100 2.441-2.589 0.345 34 0.22 655 X-RAY DIFFRACTION 99.8551 2.589-2.768 0.222 51 575 X-RAY DIFFRACTION 99.6815 2.768-2.989 0.322 26 0.212 579 X-RAY DIFFRACTION 99.6705 2.989-3.274 0.261 24 0.176 509 X-RAY DIFFRACTION 97.619 3.274-3.66 0.258 22 0.199 478 X-RAY DIFFRACTION 96.8992 3.66-4.225 0.099 15 411 X-RAY DIFFRACTION 95.7303 4.225-5.171 0.179 27 0.163 361 X-RAY DIFFRACTION 97.4874 5.171-7.299 0.31 8 0.179 285 X-RAY DIFFRACTION 95.1299 7.299-50 0.397 3 0.295 131 X-RAY DIFFRACTION 66.6667