ソフトウェア | 名称 | バージョン | 分類 |
---|
PHENIX | 1.7.3_928精密化 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | PHASER | | 位相決定 | |
|
---|
精密化 | 解像度: 1.371→26.426 Å / SU ML: 0.21 / 交差検証法: FREE R-VALUE / σ(F): 0 / 位相誤差: 22.45
| Rfactor | 反射数 | %反射 |
---|
Rfree | 0.2211 | 1943 | 4 % |
---|
Rwork | 0.2014 | - | - |
---|
obs | 0.2025 | 48521 | 92.09 % |
---|
|
---|
溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / Bsol: 53.696 Å2 / ksol: 0.425 e/Å3 |
---|
原子変位パラメータ | | Baniso -1 | Baniso -2 | Baniso -3 |
---|
1- | -3.5494 Å2 | 0 Å2 | 0 Å2 |
---|
2- | - | 3.6704 Å2 | 0 Å2 |
---|
3- | - | - | 2.7568 Å2 |
---|
|
---|
精密化ステップ | サイクル: LAST / 解像度: 1.371→26.426 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
---|
原子数 | 2201 | 0 | 92 | 356 | 2649 |
---|
|
---|
拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
---|
X-RAY DIFFRACTION | f_bond_d0.006 | 2337 | X-RAY DIFFRACTION | f_angle_d1.266 | 3188 | X-RAY DIFFRACTION | f_dihedral_angle_d15.586 | 874 | X-RAY DIFFRACTION | f_chiral_restr0.082 | 369 | X-RAY DIFFRACTION | f_plane_restr0.005 | 404 | | | | | |
|
---|
LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
---|
1.371-1.4052 | 0.3486 | 133 | 0.3031 | 3122 | X-RAY DIFFRACTION | 88 | 1.4052-1.4432 | 0.3075 | 139 | 0.288 | 3161 | X-RAY DIFFRACTION | 89 | 1.4432-1.4857 | 0.3198 | 135 | 0.259 | 3267 | X-RAY DIFFRACTION | 92 | 1.4857-1.5337 | 0.3099 | 139 | 0.2382 | 3348 | X-RAY DIFFRACTION | 94 | 1.5337-1.5885 | 0.2897 | 143 | 0.2241 | 3376 | X-RAY DIFFRACTION | 95 | 1.5885-1.652 | 0.254 | 139 | 0.2159 | 3438 | X-RAY DIFFRACTION | 96 | 1.652-1.7272 | 0.22 | 143 | 0.2097 | 3425 | X-RAY DIFFRACTION | 96 | 1.7272-1.8183 | 0.2414 | 143 | 0.2037 | 3441 | X-RAY DIFFRACTION | 95 | 1.8183-1.9322 | 0.224 | 144 | 0.1961 | 3454 | X-RAY DIFFRACTION | 96 | 1.9322-2.0813 | 0.2217 | 143 | 0.1892 | 3429 | X-RAY DIFFRACTION | 95 | 2.0813-2.2906 | 0.2159 | 140 | 0.1792 | 3407 | X-RAY DIFFRACTION | 94 | 2.2906-2.6218 | 0.1955 | 140 | 0.1945 | 3399 | X-RAY DIFFRACTION | 93 | 2.6218-3.3022 | 0.2082 | 142 | 0.1883 | 3412 | X-RAY DIFFRACTION | 93 | 3.3022-26.4309 | 0.2366 | 120 | 0.1985 | 2899 | X-RAY DIFFRACTION | 76 |
|
---|
精密化 TLS | 手法: refined / Origin x: -0.9985 Å / Origin y: -6.2351 Å / Origin z: 2.0627 Å
| 11 | 12 | 13 | 21 | 22 | 23 | 31 | 32 | 33 |
---|
T | 0.1034 Å2 | 0.0105 Å2 | -0.0086 Å2 | - | 0.1073 Å2 | 0.0019 Å2 | - | - | 0.1086 Å2 |
---|
L | 0.2352 °2 | 0.1388 °2 | -0.065 °2 | - | 0.3387 °2 | 0.0259 °2 | - | - | 0.2557 °2 |
---|
S | 0.0212 Å ° | 0.0055 Å ° | -0.01 Å ° | 0.0108 Å ° | -0.002 Å ° | -0.0126 Å ° | 0.0062 Å ° | 0.0082 Å ° | 0 Å ° |
---|
|
---|
精密化 TLSグループ | Selection details: all |
---|