ソフトウェア | 名称 | バージョン | 分類 |
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PHENIX | (phenix.refine: 1.8_1069)精密化 | PHASER | | 位相決定 | CNS | (phenix.refine: 1.8_1069)精密化 | REFMAC | (phenix.refine: 1.8_1069)精密化 | HKL-2000 | | データ収集 | HKL-2000 | | データ削減 | HKL-2000 | | データスケーリング | | | |
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精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 4D9L 解像度: 1.999→41.088 Å / SU ML: 0.29 / σ(F): 1.34 / 位相誤差: 26.26 / 立体化学のターゲット値: ML
| Rfactor | 反射数 | %反射 | Selection details |
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Rfree | 0.2453 | 3202 | 10 % | RANDOM |
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Rwork | 0.1856 | - | - | - |
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all | 0.1913 | 32446 | - | - |
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obs | 0.1913 | 32031 | 98.72 % | - |
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溶媒の処理 | 減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL |
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精密化ステップ | サイクル: LAST / 解像度: 1.999→41.088 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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原子数 | 3209 | 0 | 0 | 252 | 3461 |
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拘束条件 | Refine-ID | タイプ | Dev ideal | 数 |
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X-RAY DIFFRACTION | f_bond_d0.007 | 3290 | X-RAY DIFFRACTION | f_angle_d1.145 | 4489 | X-RAY DIFFRACTION | f_dihedral_angle_d14.219 | 1158 | X-RAY DIFFRACTION | f_chiral_restr0.071 | 519 | X-RAY DIFFRACTION | f_plane_restr0.005 | 571 | | | | | |
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LS精密化 シェル | 解像度 (Å) | Rfactor Rfree | Num. reflection Rfree | Rfactor Rwork | Num. reflection Rwork | Refine-ID | % reflection obs (%) |
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1.9992-2.029 | 0.3524 | 124 | 0.3348 | 1064 | X-RAY DIFFRACTION | 84 | 2.029-2.0608 | 0.3567 | 135 | 0.3026 | 1138 | X-RAY DIFFRACTION | 91 | 2.0608-2.0945 | 0.3414 | 126 | 0.2924 | 1235 | X-RAY DIFFRACTION | 97 | 2.0945-2.1307 | 0.327 | 131 | 0.2813 | 1261 | X-RAY DIFFRACTION | 100 | 2.1307-2.1694 | 0.2811 | 145 | 0.2723 | 1279 | X-RAY DIFFRACTION | 100 | 2.1694-2.2111 | 0.3522 | 128 | 0.2591 | 1272 | X-RAY DIFFRACTION | 100 | 2.2111-2.2562 | 0.3295 | 152 | 0.2459 | 1252 | X-RAY DIFFRACTION | 100 | 2.2562-2.3053 | 0.3038 | 151 | 0.2518 | 1277 | X-RAY DIFFRACTION | 100 | 2.3053-2.3589 | 0.2865 | 128 | 0.2295 | 1242 | X-RAY DIFFRACTION | 100 | 2.3589-2.4179 | 0.2681 | 157 | 0.2168 | 1261 | X-RAY DIFFRACTION | 100 | 2.4179-2.4833 | 0.2681 | 182 | 0.217 | 1226 | X-RAY DIFFRACTION | 100 | 2.4833-2.5563 | 0.3107 | 138 | 0.2177 | 1255 | X-RAY DIFFRACTION | 100 | 2.5563-2.6388 | 0.2961 | 153 | 0.2015 | 1256 | X-RAY DIFFRACTION | 100 | 2.6388-2.7331 | 0.2637 | 140 | 0.1971 | 1283 | X-RAY DIFFRACTION | 100 | 2.7331-2.8425 | 0.2619 | 153 | 0.1875 | 1254 | X-RAY DIFFRACTION | 100 | 2.8425-2.9719 | 0.2695 | 147 | 0.1908 | 1267 | X-RAY DIFFRACTION | 100 | 2.9719-3.1285 | 0.2665 | 152 | 0.1834 | 1260 | X-RAY DIFFRACTION | 100 | 3.1285-3.3244 | 0.2477 | 118 | 0.1754 | 1280 | X-RAY DIFFRACTION | 100 | 3.3244-3.581 | 0.1972 | 147 | 0.1663 | 1270 | X-RAY DIFFRACTION | 100 | 3.581-3.9411 | 0.2069 | 102 | 0.1584 | 1314 | X-RAY DIFFRACTION | 100 | 3.9411-4.5108 | 0.1815 | 133 | 0.1372 | 1283 | X-RAY DIFFRACTION | 100 | 4.5108-5.6807 | 0.1914 | 133 | 0.1351 | 1292 | X-RAY DIFFRACTION | 100 | 5.6807-41.0968 | 0.2016 | 127 | 0.1663 | 1308 | X-RAY DIFFRACTION | 100 |
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精密化 TLS | 手法: refined / Refine-ID: X-RAY DIFFRACTION ID | L11 (°2) | L12 (°2) | L13 (°2) | L22 (°2) | L23 (°2) | L33 (°2) | S11 (Å °) | S12 (Å °) | S13 (Å °) | S21 (Å °) | S22 (Å °) | S23 (Å °) | S31 (Å °) | S32 (Å °) | S33 (Å °) | T11 (Å2) | T12 (Å2) | T13 (Å2) | T22 (Å2) | T23 (Å2) | T33 (Å2) | Origin x (Å) | Origin y (Å) | Origin z (Å) |
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1 | 1.5762 | -0.1316 | 0.0447 | 1.785 | -1.2069 | 1.3979 | 0.0487 | 0.0773 | -0.0325 | -0.0059 | -0.062 | 0.0039 | 0.0254 | 0.0668 | 0.0355 | 0.1382 | 0.0025 | 0.0138 | 0.1469 | -0.0649 | 0.1676 | -14.9221 | 13.1217 | 10.0222 | 2 | 2.3026 | -0.8554 | 0.4973 | 1.3185 | -0.9974 | 1.6003 | -0.0077 | -0.0778 | 0.0912 | 0.069 | 0.0874 | 0.1146 | -0.0566 | -0.122 | -0.0589 | 0.1542 | 0.0056 | 0.0167 | 0.1509 | -0.0745 | 0.1456 | -32.2451 | 17.9741 | 12.6859 |
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精密化 TLSグループ | ID | Refine-ID | Refine TLS-ID | Selection details |
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1 | X-RAY DIFFRACTION | 1 | chain 'L' and (resid 2 through 210 )2 | X-RAY DIFFRACTION | 2 | chain 'H' and (resid 1 through 215 ) | |
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