AUTHOR STATES THAT THE ELECTRON DENSITY FOR THE METHIONINE MOIETY OF THE SAM LIGAND, WHICH INCLUDES ...AUTHOR STATES THAT THE ELECTRON DENSITY FOR THE METHIONINE MOIETY OF THE SAM LIGAND, WHICH INCLUDES THE METHYL GROUP, IS NOT AS GOOD AS THE ADENINE AND RIBOSE GROUPS. ALTHOUGH THE TEMPERATURE FACTOR OF THE METHYL GROUP IS SIMILAR TO THE ATOMS OF THE METHIONINE MOIETY OF THE SAM LIGAND, THE POSSIBILITY THAT THE METHYL GROUP IS NOT PRESENT CANNOT BE RULED OUT.
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.66 Å3/Da / 溶媒含有率: 53.72 %
結晶化
温度: 298 K / 手法: 蒸発脱水法 / pH: 4.2 詳細: 20% PEG 8000, 0.2 M NaCl, 0.1 M Citrate Phosphate, 10 mM TCEP, pH 4.2, EVAPORATION, temperature 298.0K
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データ収集
回折
平均測定温度: 100 K
放射光源
由来: シンクロトロン / サイト: ALS / ビームライン: 5.0.2 / 波長: 0.9795 Å
解像度: 2.75→50 Å / Cor.coef. Fo:Fc: 0.942 / Cor.coef. Fo:Fc free: 0.888 / SU B: 13.849 / SU ML: 0.277 / 交差検証法: THROUGHOUT / ESU R: 1.531 / ESU R Free: 0.389 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT
Rfactor
反射数
%反射
Selection details
Rfree
0.28338
536
4.8 %
RANDOM
Rwork
0.20583
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-
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obs
0.20945
10693
99.88 %
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溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 52.264 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.08 Å2
0 Å2
0 Å2
2-
-
1.4 Å2
0 Å2
3-
-
-
-2.48 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.75→50 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2555
0
27
0
2582
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.019
2636
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.623
1.977
3568
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.827
5
326
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
36.807
23.465
127
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
20.221
15
435
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
16.998
15
22
X-RAY DIFFRACTION
r_chiral_restr
0.103
0.2
394
X-RAY DIFFRACTION
r_gen_planes_refined
0.006
0.021
2021
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20