解像度: 1.5→1.6 Å / Rmerge(I) obs: 0.52 / Mean I/σ(I) obs: 2.8 / % possible all: 99.8
-
解析
ソフトウェア
名称
分類
XDS
データスケーリング
REFMAC
精密化
XDS
データ削減
XSCALE
データスケーリング
REFMAC
位相決定
精密化
構造決定の手法: 分子置換 / 解像度: 1.5→10 Å / Cor.coef. Fo:Fc: 0.967 / Cor.coef. Fo:Fc free: 0.956 / SU B: 2.927 / SU ML: 0.049 / 交差検証法: THROUGHOUT / ESU R: 0.098 / ESU R Free: 0.078 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN USED IF PRESENT IN THE INPUT
Rfactor
反射数
%反射
Selection details
Rfree
0.20334
2651
5 %
RANDOM
Rwork
0.16877
-
-
-
obs
0.17051
50352
99.4 %
-
all
-
50352
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 21.59 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.69 Å2
0 Å2
0 Å2
2-
-
0.69 Å2
0 Å2
3-
-
-
-1.39 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.5→10 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
2791
0
80
293
3164
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.009
0.02
2950
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.533
2.018
3973
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.104
5
350
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.572
24.435
124
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.969
15
505
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
14.403
15
13
X-RAY DIFFRACTION
r_chiral_restr
0.08
0.2
435
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.021
2170
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
1.262
3
2950
X-RAY DIFFRACTION
r_sphericity_free
26.906
5
98
X-RAY DIFFRACTION
r_sphericity_bonded
8.735
5
3066
LS精密化 シェル
解像度: 1.5→1.538 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.284
172
-
Rwork
0.23
3281
-
obs
-
-
99.97 %
精密化 TLS
手法: refined / Origin x: 14.8074 Å / Origin y: 4.984 Å / Origin z: 26.1023 Å